P

Inventor

REBER DOUGLAS M

US56 patents
⚠️ This page may combine multiple inventors who share the name “REBER DOUGLAS M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

REBER DOUGLAS M

16 patents
US9082824B2Jul 14, 2015

Method for forming an electrical connection between metal layers

REBER DOUGLAS M13 citations84
US8694926B2Apr 8, 2014

Techniques for checking computer-aided design layers of a device to reduce the occurrence of missing deck rules

REBER DOUGLAS M4 citations73
US9601354B2Mar 21, 2017

Semiconductor manufacturing for forming bond pads and seal rings

REBER DOUGLAS M2 citations70
US8707231B2Apr 22, 2014

Method and system for derived layer checking for semiconductor device design

REBER DOUGLAS M3 citations63
US10553508B2Feb 4, 2020

Semiconductor manufacturing using disposable test circuitry within scribe lanes

REBER DOUGLAS M1 citations60
US9318409B1Apr 19, 2016

Integrated circuit heater for reducing stress in the integrated circuit material and chip leads of the integrated circuit, and for optimizing performance of devices of the integrated circuit

REBER DOUGLAS M1 citations52
US9236344B2Jan 12, 2016

Thin beam deposited fuse

REBER DOUGLAS M0 citations52
US9122829B2Sep 1, 2015

Stress migration mitigation

REBER DOUGLAS M0 citations52
US8987916B2Mar 24, 2015

Methods and apparatus to improve reliability of isolated vias

REBER DOUGLAS M0 citations52
US8972922B2Mar 3, 2015

Method for forming an electrical connection between metal layers

REBER DOUGLAS M1 citations52
US8883639B2Nov 11, 2014

Semiconductor device having a nanotube layer and method for forming

REBER DOUGLAS M0 citations52
US8736071B2May 27, 2014

Semiconductor device with vias on a bridge connecting two buses

REBER DOUGLAS M0 citations52
US8703507B1Apr 22, 2014

Method and apparatus to improve reliability of vias

REBER DOUGLAS M0 citations52
US8640072B1Jan 28, 2014

Method for forming an electrical connection between metal layers

REBER DOUGLAS M1 citations52
US9041209B2May 26, 2015

Method and apparatus to improve reliability of vias

REBER DOUGLAS M0 citations51
US8486839B2Jul 16, 2013

Methods and apparatus to improve reliability of isolated vias

REBER DOUGLAS M0 citations51

FREESCALE SEMICONDUCTOR INC

15 patents
US9445050B2Sep 13, 2016

Teleconferencing environment having auditory and visual cues

FREESCALE SEMICONDUCTOR INC9 citations84
US8946000B2Feb 3, 2015

Method for forming an integrated circuit having a programmable fuse

FREESCALE SEMICONDUCTOR INC8 citations84
US9818642B2Nov 14, 2017

Method of forming inter-level dielectric structures on semiconductor devices

FREESCALE SEMICONDUCTOR INC2 citations73
US9515006B2Dec 6, 2016

3D device packaging using through-substrate posts

FREESCALE SEMICONDUCTOR INC5 citations73
US9466569B2Oct 11, 2016

Though-substrate vias (TSVs) and method therefor

FREESCALE SEMICONDUCTOR INC4 citations73
US9934349B2Apr 3, 2018

Method for verifying design rule checks

FREESCALE SEMICONDUCTOR INC5 citations66
US10014257B2Jul 3, 2018

Apparatus and method for placing stressors within an integrated circuit device to manage electromigration failures

FREESCALE SEMICONDUCTOR INC0 citations52
US10008447B2Jun 26, 2018

Solar cell powered integrated circuit device and method therefor

FREESCALE SEMICONDUCTOR INC1 citations52
US9640430B2May 2, 2017

Semiconductor device with graphene encapsulated metal and method therefor

FREESCALE SEMICONDUCTOR INC0 citations52
US9508701B2Nov 29, 2016

3D device packaging using through-substrate pillars

FREESCALE SEMICONDUCTOR INC1 citations52
US9508702B2Nov 29, 2016

3D device packaging using through-substrate posts

FREESCALE SEMICONDUCTOR INC1 citations52
US9245817B2Jan 26, 2016

Semiconductor device with embedded heat spreading

FREESCALE SEMICONDUCTOR INC0 citations52
US9224692B2Dec 29, 2015

Semiconductor device having a nanotube layer and method for forming

FREESCALE SEMICONDUCTOR INC0 citations52
US9142507B1Sep 22, 2015

Stress migration mitigation utilizing induced stress effects in metal trace of integrated circuit device

FREESCALE SEMICONDUCTOR INC1 citations52
US9122812B2Sep 1, 2015

Semiconductor device with vias on a bridge connecting two buses

FREESCALE SEMICONDUCTOR INC0 citations52

SHROFF MEHUL D

5 patents

MOTOROLA INC

3 patents

NXP USA INC

3 patents

TRAVIS EDWARD O

3 patents

PENN STATE RES FOUND

2 patents

DELCO ELECTRONICS CORP

1 patent

AJURIA SERGIO A

1 patent

ADVANCED MICRO DEVICES INC

1 patent

Showing the top 50 of 56 patents by PatentIndex Score.