Inventor
REBER DOUGLAS M
US56 patents
⚠️ This page may combine multiple inventors who share the name “REBER DOUGLAS M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
REBER DOUGLAS M
16 patentsUS9082824B2Jul 14, 2015
Method for forming an electrical connection between metal layers
REBER DOUGLAS M13 citations84
US8694926B2Apr 8, 2014
Techniques for checking computer-aided design layers of a device to reduce the occurrence of missing deck rules
REBER DOUGLAS M4 citations73
US9601354B2Mar 21, 2017
Semiconductor manufacturing for forming bond pads and seal rings
REBER DOUGLAS M2 citations70
US8707231B2Apr 22, 2014
Method and system for derived layer checking for semiconductor device design
REBER DOUGLAS M3 citations63
US10553508B2Feb 4, 2020
Semiconductor manufacturing using disposable test circuitry within scribe lanes
REBER DOUGLAS M1 citations60
US9318409B1Apr 19, 2016
Integrated circuit heater for reducing stress in the integrated circuit material and chip leads of the integrated circuit, and for optimizing performance of devices of the integrated circuit
REBER DOUGLAS M1 citations52
US9236344B2Jan 12, 2016
Thin beam deposited fuse
REBER DOUGLAS M0 citations52
US9122829B2Sep 1, 2015
Stress migration mitigation
REBER DOUGLAS M0 citations52
US8987916B2Mar 24, 2015
Methods and apparatus to improve reliability of isolated vias
REBER DOUGLAS M0 citations52
US8972922B2Mar 3, 2015
Method for forming an electrical connection between metal layers
REBER DOUGLAS M1 citations52
US8883639B2Nov 11, 2014
Semiconductor device having a nanotube layer and method for forming
REBER DOUGLAS M0 citations52
US8736071B2May 27, 2014
Semiconductor device with vias on a bridge connecting two buses
REBER DOUGLAS M0 citations52
US8703507B1Apr 22, 2014
Method and apparatus to improve reliability of vias
REBER DOUGLAS M0 citations52
US8640072B1Jan 28, 2014
Method for forming an electrical connection between metal layers
REBER DOUGLAS M1 citations52
US9041209B2May 26, 2015
Method and apparatus to improve reliability of vias
REBER DOUGLAS M0 citations51
US8486839B2Jul 16, 2013
Methods and apparatus to improve reliability of isolated vias
REBER DOUGLAS M0 citations51
FREESCALE SEMICONDUCTOR INC
15 patentsUS9445050B2Sep 13, 2016
Teleconferencing environment having auditory and visual cues
FREESCALE SEMICONDUCTOR INC9 citations84
US8946000B2Feb 3, 2015
Method for forming an integrated circuit having a programmable fuse
FREESCALE SEMICONDUCTOR INC8 citations84
US9818642B2Nov 14, 2017
Method of forming inter-level dielectric structures on semiconductor devices
FREESCALE SEMICONDUCTOR INC2 citations73
US9515006B2Dec 6, 2016
3D device packaging using through-substrate posts
FREESCALE SEMICONDUCTOR INC5 citations73
US9466569B2Oct 11, 2016
Though-substrate vias (TSVs) and method therefor
FREESCALE SEMICONDUCTOR INC4 citations73
US9934349B2Apr 3, 2018
Method for verifying design rule checks
FREESCALE SEMICONDUCTOR INC5 citations66
US10014257B2Jul 3, 2018
Apparatus and method for placing stressors within an integrated circuit device to manage electromigration failures
FREESCALE SEMICONDUCTOR INC0 citations52
US10008447B2Jun 26, 2018
Solar cell powered integrated circuit device and method therefor
FREESCALE SEMICONDUCTOR INC1 citations52
US9640430B2May 2, 2017
Semiconductor device with graphene encapsulated metal and method therefor
FREESCALE SEMICONDUCTOR INC0 citations52
US9508701B2Nov 29, 2016
3D device packaging using through-substrate pillars
FREESCALE SEMICONDUCTOR INC1 citations52
US9508702B2Nov 29, 2016
3D device packaging using through-substrate posts
FREESCALE SEMICONDUCTOR INC1 citations52
US9245817B2Jan 26, 2016
Semiconductor device with embedded heat spreading
FREESCALE SEMICONDUCTOR INC0 citations52
US9224692B2Dec 29, 2015
Semiconductor device having a nanotube layer and method for forming
FREESCALE SEMICONDUCTOR INC0 citations52
US9142507B1Sep 22, 2015
Stress migration mitigation utilizing induced stress effects in metal trace of integrated circuit device
FREESCALE SEMICONDUCTOR INC1 citations52
US9122812B2Sep 1, 2015
Semiconductor device with vias on a bridge connecting two buses
FREESCALE SEMICONDUCTOR INC0 citations52
SHROFF MEHUL D
5 patentsUS9455220B2Sep 27, 2016
Apparatus and method for placing stressors on interconnects within an integrated circuit device to manage electromigration failures
SHROFF MEHUL D8 citations84
US8601430B1Dec 3, 2013
Device matching tool and methods thereof
SHROFF MEHUL D13 citations84
US8595667B1Nov 26, 2013
Via placement and electronic circuit design processing method and electronic circuit design utilizing same
SHROFF MEHUL D10 citations84
US9443804B2Sep 13, 2016
Capping layer interface interruption for stress migration mitigation
SHROFF MEHUL D3 citations73
US8832624B1Sep 9, 2014
Multi-layer process-induced damage tracking and remediation
SHROFF MEHUL D4 citations73
MOTOROLA INC
3 patentsUS6713381B2Mar 30, 2004
Method of forming semiconductor device including interconnect barrier layers
MOTOROLA INC135 citations95
US6597234B2Jul 22, 2003
Anti-fuse circuit and method of operation
MOTOROLA INC27 citations89
US6555915B1Apr 29, 2003
Integrated circuit having interconnect to a substrate and method therefor
MOTOROLA INC7 citations74
NXP USA INC
3 patentsUS10522615B2Dec 31, 2019
Semiconductor package with embedded capacitor and methods of manufacturing same
NXP USA INC2 citations71
US10262893B2Apr 16, 2019
Method of forming inter-level dielectric structures on semiconductor devices
NXP USA INC0 citations52
US10204860B2Feb 12, 2019
Semiconductor device with graphene encapsulated metal and method therefor
NXP USA INC0 citations52
TRAVIS EDWARD O
3 patentsUS9652577B2May 16, 2017
Integrated circuit design using pre-marked circuit element object library
TRAVIS EDWARD O3 citations71
US8796841B2Aug 5, 2014
Semiconductor device with embedded heat spreading
TRAVIS EDWARD O2 citations61
US8581390B2Nov 12, 2013
Semiconductor device with heat dissipation
TRAVIS EDWARD O1 citations51
PENN STATE RES FOUND
2 patentsUS6531193B2Mar 11, 2003
Low temperature, high quality silicon dioxide thin films deposited using tetramethylsilane (TMS) for stress control and coverage applications
PENN STATE RES FOUND586 citations99
US6159559ADec 12, 2000
Low temperature, high quality silicon dioxide thin films deposited using tetramethylsilane (TMS)
PENN STATE RES FOUND27 citations92
DELCO ELECTRONICS CORP
1 patentAJURIA SERGIO A
1 patentADVANCED MICRO DEVICES INC
1 patentShowing the top 50 of 56 patents by PatentIndex Score.