Inventor
HATTORI NOBUYOSHI
JP22 patents
⚠️ This page may combine multiple inventors who share the name “HATTORI NOBUYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
12 patentsUS6372593B1Apr 16, 2002
Method of manufacturing SOI substrate and semiconductor device
MITSUBISHI ELECTRIC CORP66 citations96
US5517027AMay 14, 1996
Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these
MITSUBISHI ELECTRIC CORP55 citations94
US6465316B2Oct 15, 2002
SOI substrate and semiconductor device
MITSUBISHI ELECTRIC CORP32 citations92
US6252294B1Jun 26, 2001
Semiconductor device and semiconductor storage device
MITSUBISHI ELECTRIC CORP34 citations92
US6016562AJan 18, 2000
Inspection data analyzing apparatus for in-line inspection with enhanced display of inspection results
MITSUBISHI ELECTRIC CORP49 citations92
US4893320AJan 9, 1990
Apparatus for counting particles attached to surfaces of a solid
MITSUBISHI ELECTRIC CORP31 citations92
US6473665B2Oct 29, 2002
Defect analysis method and process control method
MITSUBISHI ELECTRIC CORP37 citations91
US6341241B1Jan 22, 2002
Defect analysis method and process control method
MITSUBISHI ELECTRIC CORP36 citations91
US6202037B1Mar 13, 2001
Quality management system and recording medium
MITSUBISHI ELECTRIC CORP49 citations88
US6646306B2Nov 11, 2003
Semiconductor device
MITSUBISHI ELECTRIC CORP8 citations74
US5048331ASep 17, 1991
Continuous rainwater monitoring system
MITSUBISHI ELECTRIC CORP11 citations74
US6914307B2Jul 5, 2005
Semiconductor device and method of manufacturing the same
MITSUBISHI ELECTRIC CORP4 citations63
RENESAS TECH CORP
4 patentsUS6844242B2Jan 18, 2005
Method of manufacturing SOI wafer
RENESAS TECH CORP18 citations83
US6741940B2May 25, 2004
Computer-implemented method of defect analysis
RENESAS TECH CORP13 citations83
US7674668B2Mar 9, 2010
Method of manufacturing a semiconductor device
RENESAS TECH CORP3 citations63
US6769111B2Jul 27, 2004
Computer-implemented method of process analysis
RENESAS TECH CORP0 citations40