Inventor · disambiguated record
Charles M. Kohn
Also filed as: KOHN CHARLES M
3 granted patents·92 citations·filing 1997–1998
74Inventor score
Files withSEMITEST INC3
Top patents by PatentIndex Score
3 records- 0174US6097205AMethod and apparatus for characterizing a specimen of semiconductor materialSEMITEST INC·Filed 1997·Granted Aug 1, 2000·51 cites·33 claims
- 0256US6163163ASemiconductor material characterizing method and apparatusSEMITEST INC·Filed 1998·Granted Dec 19, 2000·23 cites·8 claims
- 0352US6034535AMethod utilizing a modulated light beam for determining characteristics such as the doping concentration profile of a specimen of semiconductor materialSEMITEST INC·Filed 1997·Granted Mar 7, 2000·18 cites·10 claims
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