Inventor
FUJII YOSHIMARO
JP27 patents
⚠️ This page may combine multiple inventors who share the name “FUJII YOSHIMARO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HAMAMATSU PHOTONICS KK
20 patentsUS7566635B2Jul 28, 2009
Substrate dividing method
HAMAMATSU PHOTONICS KK172 citations99
US9543207B2Jan 10, 2017
Substrate dividing method
HAMAMATSU PHOTONICS KK6 citations93
US6933489B2Aug 23, 2005
Back illuminated photodiode array and method of manufacturing the same
HAMAMATSU PHOTONICS KK29 citations92
US10068801B2Sep 4, 2018
Substrate dividing method
HAMAMATSU PHOTONICS KK4 citations84
US9553023B2Jan 24, 2017
Substrate dividing method
HAMAMATSU PHOTONICS KK3 citations84
US9548246B2Jan 17, 2017
Substrate dividing method
HAMAMATSU PHOTONICS KK4 citations84
US9543256B2Jan 10, 2017
Substrate dividing method
HAMAMATSU PHOTONICS KK2 citations84
US7649236B2Jan 19, 2010
Semiconductor photodetector and photodetecting device having layers with specific crystal orientations
HAMAMATSU PHOTONICS KK15 citations84
US7336808B2Feb 26, 2008
Optical sensor
HAMAMATSU PHOTONICS KK13 citations83
US11424162B2Aug 23, 2022
Substrate dividing method
HAMAMATSU PHOTONICS KK1 citations73
US11101315B2Aug 24, 2021
Detector, PET system and X-ray CT system
HAMAMATSU PHOTONICS KK2 citations73
US10622255B2Apr 14, 2020
Substrate dividing method
HAMAMATSU PHOTONICS KK0 citations63
US9711405B2Jul 18, 2017
Substrate dividing method
HAMAMATSU PHOTONICS KK1 citations63
US9287177B2Mar 15, 2016
Substrate dividing method
HAMAMATSU PHOTONICS KK1 citations63
US9142458B2Sep 22, 2015
Substrate dividing method
HAMAMATSU PHOTONICS KK1 citations63
US8889525B2Nov 18, 2014
Substrate dividing method
HAMAMATSU PHOTONICS KK1 citations63
US10879303B2Dec 29, 2020
Detector, PET system and X-ray CT system
HAMAMATSU PHOTONICS KK0 citations52
US9385151B2Jul 5, 2016
Manufacturing method for edge illuminated type photodiode and semiconductor wafer
HAMAMATSU PHOTONICS KK0 citations50
US8993361B2Mar 31, 2015
Manufacturing method for edge illuminated type photodiode and semiconductor wafer
HAMAMATSU PHOTONICS KK1 citations50
US7960202B2Jun 14, 2011
Photodiode array having semiconductor substrate and crystal fused regions and method for making thereof
HAMAMATSU PHOTONICS KK0 citations42
FUJII YOSHIMARO
6 patentsUS8314013B2Nov 20, 2012
Semiconductor chip manufacturing method
FUJII YOSHIMARO23 citations96
US8304325B2Nov 6, 2012
Substrate dividing method
FUJII YOSHIMARO25 citations96
US8268704B2Sep 18, 2012
Method for dicing substrate
FUJII YOSHIMARO25 citations96
US8518800B2Aug 27, 2013
Substrate dividing method
FUJII YOSHIMARO13 citations92
US8518801B2Aug 27, 2013
Substrate dividing method
FUJII YOSHIMARO8 citations92
US8519511B2Aug 27, 2013
Substrate dividing method
FUJII YOSHIMARO10 citations92