P
US10068801B2ExpiredUtilityPatentIndex 84

Substrate dividing method

Assignee: HAMAMATSU PHOTONICS KKPriority: Mar 12, 2002Filed: Jun 8, 2017Granted: Sep 4, 2018
Est. expiryMar 12, 2022(expired)· nominal 20-yr term from priority
Inventors:FUJII YOSHIMAROFUKUYO FUMITSUGUFUKUMITSU KENSHIUCHIYAMA NAOKI
H10P 72/7416H10P 72/742H10P 72/7402H10P 52/00H10P 50/642H10P 34/42H10W 46/503H10W 46/00H10W 42/121H10W 20/068H10P 54/00B23K 26/40B23K 26/53B23K 2103/50B23K 26/0622B28D 5/00B28D 5/0011B23K 2203/50H01L 21/78H01L 2223/5446B23K 26/0057H01L 2924/00H01L 21/6836H01L 2221/68327H01L 2924/0002H01L 21/76894H01L 21/304H01L 2221/68336H01L 21/30604H01L 23/562H01L 23/544H01L 21/268
84
PatentIndex Score
4
Cited by
532
References
5
Claims

Abstract

A substrate dividing method which can thin and divide a substrate while preventing chipping and cracking from occurring. This substrate dividing method comprises the steps of irradiating a semiconductor substrate 1 having a front face 3 formed with functional devices 19 with laser light while positioning a light-converging point within the substrate, so as to form a modified region including a molten processed region due to multiphoton absorption within the semiconductor substrate 1 , and causing the modified region including the molten processed region to form a starting point region for cutting; and grinding a rear face 21 of the semiconductor substrate 1 after the step of forming the starting point region for cutting such that the semiconductor substrate 1 attains a predetermined thickness.

Claims

exact text as granted — not AI-modified
The invention claimed is: 
     
       1. A method of manufacturing a semiconductor chip, the manufacturing method comprising steps of:
 irradiating internal locations inside of a semiconductor wafer with laser light, thereby forming a plurality of modified regions along each line of a plurality of intersecting cutting lines arranged in a grid, the semiconductor wafer having a plurality of functional elements formed on a front face of the semiconductor wafer; 
 grinding a rear face of the semiconductor wafer after formation of all of the modified regions, wherein after completion of the grinding step, a fracture extending from each modified region in a thickness direction of the semiconductor wafer reaches the rear face of the semiconductor wafer; 
 chemically etching the rear thee of the semiconductor substrate, thereby forming a plurality of chamfers along each of the plurality of cutting lines arranged in the grid; and 
 dividing the semiconductor wafer, wherein the semiconductor wafer is divided when a fracture from each modified region reaches the front face and the rear face of the semiconductor wafer, thereby providing at least one manufactured semiconductor chip. 
 
     
     
       2. The method of manufacturing a semiconductor chip according to  claim 1 , wherein the chamfers form V-shaped surfaces along each of the cutting lines. 
     
     
       3. The method of manufacturing a semiconductor chip according to  claim 1 , wherein the chamfers comprise angled surfaces facing in at least four different directions. 
     
     
       4. The method of manufacturing a semiconductor chip according to  claim 1 , wherein the dividing step comprises dividing the semiconductor wafer by expanding an expanding film attached to the rear face of the semiconductor wafer. 
     
     
       5. The method of manufacturing a semiconductor chip according to  claim 1 , wherein the method comprises a step of attaching a protective film on the front face of the semiconductor wafer before forming the plurality of a modified regions.

Cited by (0)

No later patents cite this yet.

References (0)

No backward citations on record.