Inventor

JEONG WOO-SEOP

KR23 patents

⚠️ This page may combine multiple inventors who share the name “JEONG WOO-SEOP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JEONG WOO-SEOP

SAMSUNG ELECTRONICS CO LTD

Data input circuits and methods of inputting data for a synchronous semiconductor memory device

Integrated circuit memory devices having programmable latency periods and methods of operating same

Word line voltage boosting circuit and method thereof

Sense amplifier of semiconductor integrated circuit

Memory device having a controller capable of disabling data input/output mask (DQM) input buffer during portions of a read operation and a write operation

Semiconductor device with test pads and pad connection unit

Internal clock generation circuit of semiconductor device and method for generating internal clock

Method for controlling data output buffer for use in operation at high frequency of synchronous memory

Semiconductor memory device and data write and read method thereof

Circuits and methods for providing variable data I/O width for semiconductor memory devices

Input buffer circuit of a synchronous semiconductor memory device

Sense amplifier of semiconductor integrated circuit

Method and memory system in which operating mode is set using address signal

Memory using packet controller and memory

Semiconductor memory device and test method thereof

Input stage of semiconductor device with multiple pads of common function, and multi-chip package having the same

Synchronous semiconductor device having constant data output time regardless of bit organization, and method of adjusting data output time

Power supply device in semiconductor memory

Memory devices with selectively enabled output circuits for test mode and method of testing the same

Semiconductor memory device with reduced number of pads

YANG HUI-KAP

Row address control circuit semiconductor memory device including the same and method of controlling row address

JEONG WOO-SEOP

Semiconductor device with test pads and pad connection unit

SAMSUNG ELECTRONICS COI LTD

Dynamic clock signal generating circuit for use in synchronous dynamic random access memory devices