Inventor · disambiguated record
Yuichi Nemoto
Also filed as: NEMOTO YUICHI
4 granted patents·3 pending applications·10 citations·filing 2007–2016
65Inventor score
Top patents by PatentIndex Score
7 records- 0172US8215175B2Quantitative evaluation device of atomic vacancies existing in silicon wafer, method for the device, silicon wafer manufacturing method, and thin-film oscillatorGOTO TERUTAKA·Filed 2008·Granted Jul 10, 2012·7 cites·11 claims
- 0270US11783248B2United states construction management system and methodKOMATSU MFG CO LTD·Filed 2016·Granted Oct 10, 2023·1 cites·30 claims
- 0365US8037761B2Quantitative evaluation device and method of atomic vacancy existing in silicon waferUNIV NIIGATA·Filed 2007·Granted Oct 18, 2011·2 cites·19 claims
- 0443US2009217866A1METHOD FOR PRODUCING Si SINGLE CRYSTAL INGOT BY CZ METHODSUMCO CORP·Filed 2007·Application pending·0 cites
- 0538US2016258908A1Method for evaluating atomic vacancy in surface layer of silicon wafer and apparatus for evaluating the sameUNIV NIIGATA·Filed 2014·Application pending·0 cites
- 0634US2018218301A1Construction management system and construction management methodKOMATSU MFG CO LTD·Filed 2016·Application pending·0 cites
- 0727US8578777B2Method for quantitatively evaluating concentration of atomic vacancies existing in silicon wafer, method for manufacturing silicon wafer, and silicon wafer manufactured by the method for manufacturing silicon waferGOTO TERUTAKA·Filed 2010·Granted Nov 12, 2013·0 cites·6 claims
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