Inventor
MIYAOKA SHUICHI
JP15 patents
⚠️ This page may combine multiple inventors who share the name “MIYAOKA SHUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
12 patentsUS6430103B2Aug 6, 2002
Semiconductor integrated circuit device with memory banks and read buffer capable of storing data read out from one memory bank when data of another memory bank is outputting
HITACHI LTD115 citations97
US6570800B2May 27, 2003
High speed clock synchronous semiconductor memory in which the column address strobe signal is varied in accordance with a clock signal
HITACHI LTD69 citations96
US5638335AJun 10, 1997
Semiconductor device
HITACHI LTD91 citations96
US6794678B2Sep 21, 2004
Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device
HITACHI LTD16 citations92
US6714477B2Mar 30, 2004
Semiconductor integrated circuit device with memory blocks and a write buffer capable of storing write data from an external interface
HITACHI LTD17 citations92
US5734616AMar 31, 1998
Semiconductor memory device and sense circuit
HITACHI LTD28 citations92
US6191990B1Feb 20, 2001
Semiconductor integrated circuit device having stabilizing capacitors connected between power lines of main amplifiers
HITACHI LTD35 citations90
US6865127B2Mar 8, 2005
Semiconductor integrated circuit device
HITACHI LTD5 citations74
US5111432AMay 5, 1992
Semiconductor integrated circuit device with power consumption reducing arrangement
HITACHI LTD7 citations73
US7023749B2Apr 4, 2006
Semiconductor integrated circuit device
HITACHI LTD2 citations63
US5373474ADec 13, 1994
Semiconductor integrated circuit device with power consumption reducing arrangement
HITACHI LTD2 citations62
US5265060ANov 23, 1993
Semiconductor integrated circuit device with power consumption reducing arrangement
HITACHI LTD3 citations62
HITACHI ULSI SYS CO LTD
2 patentsUS7162671B2Jan 9, 2007
Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device
HITACHI ULSI SYS CO LTD6 citations73
US7113434B2Sep 26, 2006
Semiconductor integrated circuit having programmable delays for generating timing signals with time difference being non-integral multiple of clock cycle
HITACHI ULSI SYS CO LTD5 citations62