Inventor

LIN WUN-JIE

TW87 patents

⚠️ This page may combine multiple inventors who share the name “LIN WUN-JIE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LIN WUN-JIE

TAIWAN SEMICONDUCTOR MFG CO LTD

Electrostatic discharge (ESD) protection circuit and method of operating the same

SCRS with checker board layouts

Electrostatic discharge device

FinFET-based ESD devices and methods for forming the same

Method and system for latch-up prevention

Circuit and method for high voltage tolerant ESD protection

Integrated circuit and method for fabricating the same

Electrostatic discharge device

Fin ESD protection diode and fabrication method thereof

FinFET-based ESD devices and methods for forming the same

SCRs with checker board layouts

Semiconductor device comprising plurality of conductive portions disposed within wells and a nanowire coupled to conductive portion

FinFET with ESD protection

Electrostatic discharge (ESD) protection circuit and method of operating the same

ESD protection device

Electrical passive elements of an ESD power clamp in a backside back end of line (B-BEOL) process

ESD protection device

ESD protection device

Semiconductor device including a vertical gate-all-around transistor and a planar transistor

ESD clamp circuit for low leakage applications

Method of making semiconductor device electrostatic discharge diode

Semiconductor device electrostatic discharge diode

Guard ring structure and method of forming the same

Method and system for manufacturing integrated circuit device

ESD protection device

High ESD immunity field-effect device and manufacturing method thereof

Guard ring and circuit device

Method and system for latch-up prevention

Integrated circuit device and method

Electrostatic discharge (ESD) protection circuit and method of operating the same

Circuit and method for high voltage tolerant ESD protection

Electrostatic discharge (ESD) array with back end of line (BEOL) connection in a carrier wafer

Capacitor cell and structure thereof

Electrical passive elements of an ESD power clamp in a backside back end of line (B-BEOL) process

Electrostatic discharge (ESD) array with circuit controlled switches

Integrated circuit device, method, and system

Electrostatic discharge (ESD) array with back end of line (BEOL) connection in a carrier wafer

TAIWAN SEMICONDUCTOR MFG

FinFET body contact and method of making same

FinFET-based ESD devices and methods for forming the same

Rotated STI diode on FinFET technology

FinFET body contact and method of making same

FinFET-based ESD devices and methods for forming the same

SCRs with checker board layouts

Apparatus for ESD protection

Semiconductor device

Integrated circuit structures having base resistance tuning regions and methods for forming the same

LIN WUN-JIE

FinFET-based ESD devices and methods for forming the same

Vertical BJT and SCR for ESD

LO CHING-HSIUNG

FinFET body contact and method of making same

TAIWAN SEMICONDUCTOR MANFACTURING COMPANY LTD

Apparatus for ESD protection