Inventor
SASAJIMA MASAHIRO
JP16 patents
⚠️ This page may combine multiple inventors who share the name “SASAJIMA MASAHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
14 patentsUS10971347B2Apr 6, 2021
Charged particle beam apparatus
HITACHI HIGH TECH CORP9 citations83
USD794816SAug 15, 2017
Sample holder for an electron microscope
HITACHI HIGH TECH CORP8 citations83
US7932733B2Apr 26, 2011
Apparatus for detecting defect by examining electric characteristics of a semiconductor device
HITACHI HIGH TECH CORP10 citations83
USD578653SOct 14, 2008
Sample holder
HITACHI HIGH TECH CORP8 citations73
US11043358B2Jun 22, 2021
Measuring apparatus and method of setting observation condition
HITACHI HIGH TECH CORP1 citations62
USD579120SOct 21, 2008
Sample holder
HITACHI HIGH TECH CORP4 citations62
USD578655SOct 14, 2008
Sample holder
HITACHI HIGH TECH CORP3 citations62
US7989766B2Aug 2, 2011
Sample inspection apparatus
HITACHI HIGH TECH CORP2 citations61
US12027342B2Jul 2, 2024
Charged particle beam device and axis adjustment method thereof
HITACHI HIGH TECH CORP0 citations60
US11764028B2Sep 19, 2023
Charged particle beam device and axis adjustment method thereof
HITACHI HIGH TECH CORP0 citations60
US11342155B2May 24, 2022
Charged particle beam device and method for adjusting position of detector of charged particle beam device
HITACHI HIGH TECH CORP0 citations60
US9349567B2May 24, 2016
Charged particle beam device
HITACHI HIGH TECH CORP0 citations51
US11610754B2Mar 21, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations49
US11183362B2Nov 23, 2021
Charged particle beam apparatus and sample observation method using the same
HITACHI HIGH TECH CORP0 citations48