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Sample holder for an electron microscope

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Assignee: HITACHI HIGH TECH CORPPriority: Oct 24, 2013Filed: Apr 23, 2014Granted: Aug 15, 2017
Est. expiryOct 24, 2033(~7.3 yrs left)· nominal 20-yr term from priority
Inventors:Kazuhiro KoyamaMasahiro Sasajima
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PatentIndex Score
8
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45
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Claims

exact text as granted — not AI-modified
CLAIM 
     
       We claim the ornamental design for a sample holder for an electron microscope, as shown and described.

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