Inventor · disambiguated record
Masahiro Sasajima
Also filed as: SASAJIMA MASAHIRO
16 granted patents·1 pending application·51 citations·filing 2007–2023
90Inventor score
Top patents by PatentIndex Score
17 records- 0190US10971347B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 6, 2021·9 cites·7 claims
- 0280US7932733B2Apparatus for detecting defect by examining electric characteristics of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2009·Granted Apr 26, 2011·10 cites·9 claims
- 0379US12027342B2Charged particle beam device and axis adjustment method thereofHITACHI HIGH TECH CORP·Filed 2023·Granted Jul 2, 2024·0 cites·4 claims
- 0470US7989766B2Sample inspection apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 2, 2011·2 cites·17 claims
- 0568US11043358B2Measuring apparatus and method of setting observation conditionHITACHI HIGH TECH CORP·Filed 2017·Granted Jun 22, 2021·1 cites·17 claims
- 0665US8309922B2Semiconductor inspection method and device that consider the effects of electron beamsANDO TOHRU·Filed 2010·Granted Nov 13, 2012·2 cites·10 claims
- 0761US8816712B2Inspection deviceNAKAMURA MITSUHIRO·Filed 2009·Granted Aug 26, 2014·4 cites·9 claims
- 0859US11764028B2Charged particle beam device and axis adjustment method thereofHITACHI HIGH TECH CORP·Filed 2018·Granted Sep 19, 2023·0 cites·8 claims
- 0954USD794816SSample holder for an electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 15, 2017·8 cites·1 claims
- 1053USD578653SSample holderHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 14, 2008·8 cites·1 claims
- 1150US9349567B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted May 24, 2016·0 cites·5 claims
- 1249US11342155B2Charged particle beam device and method for adjusting position of detector of charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted May 24, 2022·0 cites·14 claims
- 1343US11610754B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Mar 21, 2023·0 cites·15 claims
- 1442USD579120SSample holderHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 21, 2008·4 cites·1 claims
- 1540US2008149848A1Sample Inspection Apparatus and Sample Inspection MethodHITACHI HIGH TECH CORP·Filed 2007·Application pending·0 cites
- 1639USD578655SSample holderHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 14, 2008·3 cites·1 claims
- 1737US11183362B2Charged particle beam apparatus and sample observation method using the sameHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 23, 2021·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →