Inventor · disambiguated record
Eric E. Vogt
Also filed as: VOGT ERIC · VOGT ERIC E
17 granted patents·7 pending applications·267 citations·filing 2000–2024
93Inventor score
Top patents by PatentIndex Score
24 records- 0191US8022832B2Methods and systems for certifying provenance of alcoholic beveragesEPROVENANCE LLC·Filed 2008·Granted Sep 20, 2011·70 cites·37 claims
- 0285US7159178B2System for supporting a virtual communityCOMMUNISPACE CORP·Filed 2002·Granted Jan 2, 2007·125 cites·37 claims
- 0384US8248254B2Methods and systems for certifying provenance of alcoholic beveragesVOGT ERIC·Filed 2011·Granted Aug 21, 2012·13 cites·20 claims
- 0483US9368007B2Methods and systems for determining a location of a containerEPROVENANCE LLC·Filed 2013·Granted Jun 14, 2016·5 cites·9 claims
- 0578US7732287B2Method of forming a body-tieHONEYWELL INT INC·Filed 2006·Granted Jun 8, 2010·8 cites·14 claims
- 0676US6903429B2Magnetic sensor integrated with CMOSHONEYWELL INT INC·Filed 2003·Granted Jun 7, 2005·21 cites·31 claims
- 0774US7322015B2Simulating a dose rate event in a circuit designHONEYWELL INT INC·Filed 2005·Granted Jan 22, 2008·7 cites·23 claims
- 0873US9875626B2Methods and systems for determining a location of a container by tracking a SIM card associated with the containerEPROVENANCE LLC·Filed 2016·Granted Jan 23, 2018·2 cites·15 claims
- 0973US9548277B2Integrated circuit stack including a patterned array of electrically conductive pillarsHONEYWELL INT INC·Filed 2015·Granted Jan 17, 2017·2 cites·20 claims
- 1067US7238541B2Method of incorporating magnetic materials in a semiconductor manufacturing processHONEYWELL INT INC·Filed 2005·Granted Jul 3, 2007·3 cites·20 claims
- 1166US9997466B2Integrated circuit stack including a patterned array of electrically conductive pillarsHONEYWELL INT INC·Filed 2016·Granted Jun 12, 2018·1 cites·20 claims
- 1257US2024347386A1Bonding layer between stacked integrated circuitsHONEYWELL INT INC·Filed 2023·Application pending·0 cites
- 1354US2025239545A1Electrical contacts and systems and techniques for forming electrical contactsHONEYWELL INT INC·Filed 2024·Application pending·0 cites
- 1449US6465324B2Recessed silicon oxidation for devices such as a CMOS SOI ICsHONEYWELL INT INC·Filed 2001·Granted Oct 15, 2002·7 cites·20 claims
- 1547US7169679B2Varactor with improved tuning rangeHONEYWELL INT INC·Filed 2002·Granted Jan 30, 2007·3 cites·9 claims
- 1645US8901702B1Programmable electrical fuse with temperature gradient between anode and cathodeHONEYWELL INT INC·Filed 2013·Granted Dec 2, 2014·0 cites·16 claims
- 1743US2008254590A1Fabrication process for silicon-on-insulator field effect transistors using high temperature nitrogen annealingVOGT ERIC E·Filed 2007·Application pending·0 cites
- 1842US2007224838A1Method of straining a silicon island for mobility improvementHONEYWELL INT INC·Filed 2006·Application pending·0 cites
- 1940US7882452B2Modeling silicon-on-insulator stress effectsHONEYWELL INT INC·Filed 2007·Granted Feb 1, 2011·0 cites·19 claims
- 2039US2007257310A1Body-tied MOSFET device with strained active areaHONEYWELL INT INC·Filed 2006·Application pending·0 cites
- 2135US6939758B2Gate length control for semiconductor chip designHONEYWELL INT INC·Filed 2003·Granted Sep 6, 2005·0 cites·18 claims
- 2234US2004257861A1Method of incorporating magnetic materials in a semiconductor manufacturing processFiled 2003·Application pending·0 cites
- 2333US6674108B2Gate length control for semiconductor chip designHONEYWELL INT INC·Filed 2000·Granted Jan 6, 2004·0 cites·34 claims
- 2432US2002137345A1Gate resistance reductionFiled 2001·Application pending·0 cites
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