Inventor
CHEN I-CHIH
TW38 patents
⚠️ This page may combine multiple inventors who share the name “CHEN I-CHIH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
35 patentsUS10090392B2Oct 2, 2018
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9812569B2Nov 7, 2017
Semiconductor device and fabricating method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US9728637B2Aug 8, 2017
Mechanism for forming semiconductor device with gate
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9768221B2Sep 19, 2017
Pad structure layout for semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD8 citations83
US11011566B2May 18, 2021
Bonding pad on a back side illuminated image sensor
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10680103B2Jun 9, 2020
Method of forming semiconductor device with gate
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9865731B2Jan 9, 2018
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9659859B2May 23, 2017
Metal pad offset for multi-layer metal layout
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9281215B2Mar 8, 2016
Mechanism for forming gate
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US10608094B2Mar 31, 2020
Semiconductor device and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10096672B2Oct 9, 2018
Semiconductor device having barrier layer to prevent impurity diffusion
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10056455B1Aug 21, 2018
Semiconductor device and method of fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US9728598B2Aug 8, 2017
Semiconductor device having barrier layer to prevent impurity diffusion
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12020933B2Jun 25, 2024
Trench etching process for photoresist line roughness improvement
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11955484B2Apr 9, 2024
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11527406B2Dec 13, 2022
Trench etching process for photoresist line roughness improvement
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US11404413B2Aug 2, 2022
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US9490345B2Nov 8, 2016
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations69
US12389625B2Aug 12, 2025
Semiconductor device with gate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12159921B2Dec 3, 2024
Semiconductor device and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11600727B2Mar 7, 2023
Method of forming semiconductor device with gate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11437495B2Sep 6, 2022
Semiconductor device and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10903336B2Jan 26, 2021
Semiconductor device and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12563826B2Feb 24, 2026
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12463035B2Nov 4, 2025
Trench etching process for photoresist line roughness improvement
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11271111B2Mar 8, 2022
Source/drain structure with barrier in FinFET device and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11145760B2Oct 12, 2021
Structure having improved fin critical dimension control
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11532728B2Dec 20, 2022
Method semiconductor device fabrication with improved epitaxial source/drain proximity control
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US10516048B2Dec 24, 2019
Fabrication of semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12255134B2Mar 18, 2025
Method of back end of line via to metal line margin improvement
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US11276638B2Mar 15, 2022
Back end of line via to metal line margin improvement
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10361287B2Jul 23, 2019
Method for manufacturing semiconductor device structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10153278B1Dec 11, 2018
Fin-type field effect transistor structure and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9450093B2Sep 20, 2016
Semiconductor device structure and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations50
US10804378B2Oct 13, 2020
Method for semiconductor device fabrication with improved epitaxial source/drain proximity control
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48