Inventor
SHIOKAWA YOSHIRO
JP29 patents
⚠️ This page may combine multiple inventors who share the name “SHIOKAWA YOSHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ANELVA CORP
21 patentsUS7005634B2Feb 28, 2006
Ionization apparatus
ANELVA CORP21 citations92
US6399213B2Jun 4, 2002
Surface treated vacuum material and a vacuum chamber having an interior surface comprising same
ANELVA CORP21 citations92
US6768108B2Jul 27, 2004
Ion attachment mass spectrometry apparatus, ionization apparatus, and ionization method
ANELVA CORP35 citations88
US4639597AJan 27, 1987
Auger electron spectrometer capable of attaining a high resolution
ANELVA CORP22 citations82
US6507020B2Jan 14, 2003
Halide compound mass spectrometry method and mass spectrometry apparatus
ANELVA CORP11 citations74
US6316052B1Nov 13, 2001
Method for the surface treatment of vacuum materials and surface treated vacuum
ANELVA CORP8 citations74
US4752685AJun 21, 1988
Electronic spectrometer for identifying element conditions of a sample surface by utilizing an energy spectrum of charged particles
ANELVA CORP15 citations74
US4652753AMar 24, 1987
Mass spectrometer capable of analyzing an insulator
ANELVA CORP8 citations74
US4562352ADec 31, 1985
Analyzing apparatus capable of analyzing a surface at a high resolution
ANELVA CORP7 citations74
US6635868B2Oct 21, 2003
Mass spectrometry apparatus
ANELVA CORP11 citations73
US6559443B2May 6, 2003
Ionization apparatus and ionization method for mass spectrometry
ANELVA CORP11 citations73
US7084397B2Aug 1, 2006
Ion attachment mass spectrometry apparatus
ANELVA CORP7 citations72
US6800848B2Oct 5, 2004
Method and apparatus for ion attachment mass spectrometry
ANELVA CORP6 citations63
US6590205B2Jul 8, 2003
Ionization method for mass spectrometry and mass spectrometry apparatus
ANELVA CORP5 citations63
US5916388AJun 29, 1999
Method and apparatus for the treatment of stainless steel surfaces
ANELVA CORP5 citations63
US7164121B2Jan 16, 2007
Ion attachment mass spectrometry method
ANELVA CORP4 citations62
US6800850B2Oct 5, 2004
Reflection type ion attachment mass spectrometry apparatus
ANELVA CORP2 citations62
US6479814B2Nov 12, 2002
Ion source for ion attachment mass spectrometry apparatus
ANELVA CORP4 citations62
US7202474B2Apr 10, 2007
Ion attachment mass spectrometry apparatus
ANELVA CORP4 citations61
US7015461B2Mar 21, 2006
Method and apparatus for ion attachment mass spectrometry
ANELVA CORP1 citations52
US4785173ANov 15, 1988
Element analyzing apparatus
ANELVA CORP0 citations52
SHIOKAWA YOSHIRO
4 patentsUS8436295B2May 7, 2013
Device for measuring mean free path, vacuum gauge, and method for measuring mean free path
SHIOKAWA YOSHIRO0 citations50
US8164051B2Apr 24, 2012
Internal standard material, resin composition, and measurement method
SHIOKAWA YOSHIRO1 citations49
US8324568B2Dec 4, 2012
Mass spectrometer and mass spectrometry method
SHIOKAWA YOSHIRO0 citations48
US8309917B2Nov 13, 2012
Mass spectrometry and mass spectrometer used for the same
SHIOKAWA YOSHIRO1 citations48