Inventor
NAKAMURA MEGUMI
JP24 patents
⚠️ This page may combine multiple inventors who share the name “NAKAMURA MEGUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ANELVA CORP
9 patentsUS7005634B2Feb 28, 2006
Ionization apparatus
ANELVA CORP21 citations92
US6635868B2Oct 21, 2003
Mass spectrometry apparatus
ANELVA CORP11 citations73
US6559443B2May 6, 2003
Ionization apparatus and ionization method for mass spectrometry
ANELVA CORP11 citations73
US7084397B2Aug 1, 2006
Ion attachment mass spectrometry apparatus
ANELVA CORP7 citations72
US6800848B2Oct 5, 2004
Method and apparatus for ion attachment mass spectrometry
ANELVA CORP6 citations63
US6590205B2Jul 8, 2003
Ionization method for mass spectrometry and mass spectrometry apparatus
ANELVA CORP5 citations63
US6479814B2Nov 12, 2002
Ion source for ion attachment mass spectrometry apparatus
ANELVA CORP4 citations62
US7202474B2Apr 10, 2007
Ion attachment mass spectrometry apparatus
ANELVA CORP4 citations61
US7015461B2Mar 21, 2006
Method and apparatus for ion attachment mass spectrometry
ANELVA CORP1 citations52
CANON ANELVA CORP
4 patentsUS7952069B2May 31, 2011
Mass spectrometer and mass spectrometry method
CANON ANELVA CORP11 citations81
US9697998B2Jul 4, 2017
Mass spectrometer
CANON ANELVA CORP2 citations71
US8049166B2Nov 1, 2011
Mass spectrometer system and mass spectrometry method
CANON ANELVA CORP1 citations51
US9373491B2Jun 21, 2016
Mass spectrometer
CANON ANELVA CORP0 citations40
SHIOKAWA YOSHIRO
4 patentsUS8436295B2May 7, 2013
Device for measuring mean free path, vacuum gauge, and method for measuring mean free path
SHIOKAWA YOSHIRO0 citations50
US8164051B2Apr 24, 2012
Internal standard material, resin composition, and measurement method
SHIOKAWA YOSHIRO1 citations49
US8324568B2Dec 4, 2012
Mass spectrometer and mass spectrometry method
SHIOKAWA YOSHIRO0 citations48
US8309917B2Nov 13, 2012
Mass spectrometry and mass spectrometer used for the same
SHIOKAWA YOSHIRO1 citations48
HITACHI HIGH TECH CORP
2 patentsUS12080511B2Sep 3, 2024
Sample holder, method for using sample holder, projection amount adjustment jig, projection amount adjustment method and charged particle beam device
HITACHI HIGH TECH CORP0 citations58
US11742178B2Aug 29, 2023
Ion milling device and milling processing method using same
HITACHI HIGH TECH CORP0 citations47