Inventor
NAKAOKA YUJI
JP29 patents
⚠️ This page may combine multiple inventors who share the name “NAKAOKA YUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
WINBOND ELECTRONICS CORP
16 patentsUS10607679B2Mar 31, 2020
Memory device and refreshing method thereof
WINBOND ELECTRONICS CORP34 citations94
US10665316B2May 26, 2020
Memory device
WINBOND ELECTRONICS CORP2 citations73
US10424362B2Sep 24, 2019
Memory device and data refreshing method thereof
WINBOND ELECTRONICS CORP6 citations73
US10395720B2Aug 27, 2019
Pseudo static random access memory and refresh method thereof
WINBOND ELECTRONICS CORP2 citations73
US11010243B2May 18, 2021
Memory apparatus with error bit correction in data reading period
WINBOND ELECTRONICS CORP1 citations62
US11004533B2May 11, 2021
Memory device and built-in self test method thereof
WINBOND ELECTRONICS CORP0 citations62
US10825546B2Nov 3, 2020
Memory device and memory peripheral circuit
WINBOND ELECTRONICS CORP1 citations62
US10586576B2Mar 10, 2020
Memory device
WINBOND ELECTRONICS CORP1 citations62
US10255954B1Apr 9, 2019
Memory device
WINBOND ELECTRONICS CORP1 citations62
US11417413B2Aug 16, 2022
Semiconductor memory apparatus and method for reading the same
WINBOND ELECTRONICS CORP0 citations52
US11270751B2Mar 8, 2022
Pseudo static random access memory and method for writing data thereof
WINBOND ELECTRONICS CORP0 citations52
US10891990B2Jan 12, 2021
Memory device
WINBOND ELECTRONICS CORP0 citations52
US10770118B2Sep 8, 2020
Reverse bias voltage adjuster
WINBOND ELECTRONICS CORP0 citations52
US10872651B2Dec 22, 2020
Volatile memory device and self-refresh method by enabling a voltage boost signal
WINBOND ELECTRONICS CORP0 citations41
US10679692B2Jun 9, 2020
Memory apparatus and majority detector thereof
WINBOND ELECTRONICS CORP0 citations41
US10566034B1Feb 18, 2020
Memory device with control and test circuit, and method for test reading and writing using bit line precharge voltage levels
WINBOND ELECTRONICS CORP0 citations41
NEC CORP
8 patentsUS6021077AFeb 1, 2000
Semiconductor memory device controlled in synchronous with external clock
NEC CORP26 citations92
US5864510AJan 26, 1999
Semiconductor memory device having a bit compressed test mode and a check mode selecting section
NEC CORP29 citations92
US5793664AAug 11, 1998
Dynamic random access memory device
NEC CORP22 citations92
US5500820AMar 19, 1996
Semiconductor memory device
NEC CORP37 citations92
US4886984ADec 12, 1989
Prohibition circuit upon power-on event
NEC CORP28 citations92
US6038648AMar 14, 2000
Semiconductor memory device having the same access timing over clock cycles
NEC CORP14 citations73
US5245573ASep 14, 1993
Semiconductor memory device having a single data bus line corresponding to one data input/output terminal
NEC CORP10 citations73
USRE36621EMar 21, 2000
Semiconductor memory device
NEC CORP2 citations62