Inventor · disambiguated record
Robert Trauner
Also filed as: TRAUNER ROBERT
4 granted patents·2 citations·filing 2017–2021
58Inventor score
Files withAPPLIED MATERIALS INC4
Top patents by PatentIndex Score
4 records- 0179US10345250B2Method of inspecting a sample with a charged particle beam device, and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2017·Granted Jul 9, 2019·2 cites·19 claims
- 0265US11610755B2Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sampleAPPLIED MATERIALS INC·Filed 2021·Granted Mar 21, 2023·0 cites·22 claims
- 0355US11195691B2Method of automatically focusing a charged particle beam on a surface region of a sample, method of calculating a converging set of sharpness values of images of a charged particle beam device and charged particle beam device for imaging a sampleAPPLIED MATERIALS INC·Filed 2019·Granted Dec 7, 2021·0 cites·21 claims
- 0430US11687008B2Method for automated critical dimension measurement on a substrate for display manufacturing, method of inspecting a large area substrate for display manufacturing, apparatus for inspecting a large area substrate for display manufacturing and method of operating thereofAPPLIED MATERIALS INC·Filed 2018·Granted Jun 27, 2023·0 cites·18 claims
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