Inventor · disambiguated record
John A. Notte, Iv
Also filed as: NOTTE IV JOHN · NOTTE IV JOHN A · NOTTE IV JOHN ANTHONY · NOTTE JOHN
57 granted patents·7 pending applications·1,039 citations·filing 2001–2025
99Inventor score
Top patents by PatentIndex Score
64 records- 0199US7557359B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·71 cites·112 claims
- 0299US7554096B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jun 30, 2009·100 cites·66 claims
- 0398US7786452B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Aug 31, 2010·61 cites·77 claims
- 0498US7557358B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·69 cites·71 claims
- 0598US7557360B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·67 cites·28 claims
- 0698US7557361B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·67 cites·110 claims
- 0798US7554097B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jun 30, 2009·74 cites·82 claims
- 0897US7786451B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Aug 31, 2010·58 cites·120 claims
- 0996US8110814B2Ion sources, systems and methodsWARD BILLY W·Filed 2009·Granted Feb 7, 2012·33 cites·20 claims
- 1096US7348556B2Method of measuring three-dimensional surface roughness of a structureFEI CO·Filed 2005·Granted Mar 25, 2008·59 cites·24 claims
- 1195US7511280B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 31, 2009·26 cites·9 claims
- 1295US7511279B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 31, 2009·29 cites·112 claims
- 1395US7504639B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 17, 2009·24 cites·31 claims
- 1494US7488952B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 10, 2009·20 cites·23 claims
- 1594US7485873B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 3, 2009·36 cites·25 claims
- 1693US7521693B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Apr 21, 2009·23 cites·107 claims
- 1793US7495232B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 24, 2009·20 cites·25 claims
- 1892US7601953B2Systems and methods for a gas field ion microscopeALIS CORP·Filed 2006·Granted Oct 13, 2009·16 cites·19 claims
- 1991US6515287B2Sectored magnetic lens and method of useKLA TENCOR TECH CORP·Filed 2001·Granted Feb 4, 2003·37 cites·20 claims
- 2090US7804068B2Determining dopant informationALIS CORP·Filed 2007·Granted Sep 28, 2010·15 cites·26 claims
- 2190US7518122B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Apr 14, 2009·19 cites·10 claims
- 2289US9236225B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Jan 12, 2016·4 cites·23 claims
- 2386US9218935B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 22, 2015·5 cites·20 claims
- 2485US6812462B1Dual electron beam instrument for multi-perspectiveKLA TENCOR TECH CORP·Filed 2003·Granted Nov 2, 2004·35 cites·16 claims
- 2583US9218934B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 22, 2015·5 cites·18 claims
- 2682US9640364B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted May 2, 2017·2 cites·18 claims
- 2781US8227753B2Multiple current charged particle methodsNOTTE IV JOHN A·Filed 2009·Granted Jul 24, 2012·6 cites·20 claims
- 2880US6926935B2Proximity depositionFEI CO·Filed 2003·Granted Aug 9, 2005·20 cites·25 claims
- 2976US8748845B2Ion sources, systems and methodsWARD BILLY W·Filed 2012·Granted Jun 10, 2014·2 cites·28 claims
- 3076US8461557B2Ion sources, systems and methodsCOMUNALE RICHARD·Filed 2008·Granted Jun 11, 2013·5 cites·16 claims
- 3176US6891167B2Apparatus and method for applying feedback control to a magnetic lensKLA TENCOR TECHNOLOGIES·Filed 2001·Granted May 10, 2005·12 cites·20 claims
- 3274US8093563B2Ion beam stabilizationRAHMAN FHM-FARIDUR·Filed 2009·Granted Jan 10, 2012·3 cites·12 claims
- 3372US8558192B2Gas delivery system with voltage gradient for an ion microscopeWARD BILLY W·Filed 2011·Granted Oct 15, 2013·2 cites·22 claims
- 3471US9159527B2Systems and methods for a gas field ionization sourceWARD BILLY W·Filed 2008·Granted Oct 13, 2015·3 cites·36 claims
- 3571US9012867B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Apr 21, 2015·1 cites·20 claims
- 3669US8633451B2Ion sources, systems and methodsWARD BILLY W·Filed 2008·Granted Jan 21, 2014·2 cites·18 claims
- 3767US8399834B2Isotope ion microscope methods and systemsNOTTE IV JOHN·Filed 2009·Granted Mar 19, 2013·2 cites·25 claims
- 3866US8124941B2Increasing current in charged particle sources and systemsNOTTE IV JOHN A·Filed 2009·Granted Feb 28, 2012·2 cites·27 claims
- 3966US8013300B2Sample decontaminationZEISS CARL NTS LLC·Filed 2009·Granted Sep 6, 2011·3 cites·19 claims
- 4065US12270774B2System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particlesZEISS CARL SMT GMBH·Filed 2024·Granted Apr 8, 2025·0 cites·20 claims
- 4164US10410828B2Charged particle beam system and methodsCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Sep 10, 2019·1 cites·22 claims
- 4261US9536699B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Jan 3, 2017·0 cites·20 claims
- 4361US2025266240A1Editing of deep, multi-layered structuresZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 4460US9530611B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 27, 2016·0 cites·19 claims
- 4560US9530612B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 27, 2016·0 cites·28 claims
- 4658US9627172B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Apr 18, 2017·0 cites·21 claims
- 4757US9029765B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2013·Granted May 12, 2015·0 cites·21 claims
- 4857US2010136255A1Ice layers in charged particle systems and methodsCARL ZEISS SMT INC·Filed 2009·Application pending·0 cites
- 4953US8648299B2Isotope ion microscope methods and systemsNOTTE IV JOHN A·Filed 2013·Granted Feb 11, 2014·0 cites·18 claims
- 5053US2019189392A1Charged particle beam system and methodsCARL ZEISS MICROSCOPY LLC·Filed 2019·Application pending·0 cites
Showing the top 50 of 64 patent records by PatentIndex Score.
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