Inventor
RODDER MARK S
US147 patents
⚠️ This page may combine multiple inventors who share the name “RODDER MARK S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
36 patentsUS6461928B2Oct 8, 2002
Methodology for high-performance, high reliability input/output devices and analog-compatible input/output and core devices using core device implants
TEXAS INSTRUMENTS INC124 citations98
US6251761B1Jun 26, 2001
Process for polycrystalline silicon gates and high-K dielectric compatibility
TEXAS INSTRUMENTS INC85 citations98
US6083836AJul 4, 2000
Transistors with substitutionally formed gate structures and method
TEXAS INSTRUMENTS INC88 citations98
US6063677AMay 16, 2000
Method of forming a MOSFET using a disposable gate and raised source and drain
TEXAS INSTRUMENTS INC91 citations98
US5079180AJan 7, 1992
Method of fabricating a raised source/drain transistor
TEXAS INSTRUMENTS INC132 citations98
US6346447B1Feb 12, 2002
Shallow-implant elevated source/drain doping from a sidewall dopant source
TEXAS INSTRUMENTS INC74 citations96
US6306712B1Oct 23, 2001
Sidewall process and method of implantation for improved CMOS with benefit of low CGD, improved doping profiles, and insensitivity to chemical processing
TEXAS INSTRUMENTS INC61 citations96
US6246091B1Jun 12, 2001
Lateral MOSFET having a barrier between the source/drain regions and the channel
TEXAS INSTRUMENTS INC42 citations96
US6187641B1Feb 13, 2001
Lateral MOSFET having a barrier between the source/drain region and the channel region using a heterostructure raised source/drain region
TEXAS INSTRUMENTS INC54 citations96
US6127233AOct 3, 2000
Lateral MOSFET having a barrier between the source/drain regions and the channel region
TEXAS INSTRUMENTS INC59 citations96
US6124627ASep 26, 2000
Lateral MOSFET having a barrier between the source/drain region and the channel region using a heterostructure raised source/drain region
TEXAS INSTRUMENTS INC72 citations96
US6063675AMay 16, 2000
Method of forming a MOSFET using a disposable gate with a sidewall dielectric
TEXAS INSTRUMENTS INC85 citations96
US5917219AJun 29, 1999
Semiconductor devices with pocket implant and counter doping
TEXAS INSTRUMENTS INC58 citations96
US5504359AApr 2, 1996
Vertical FET device with low gate to source overlap capacitance
TEXAS INSTRUMENTS INC63 citations96
US5108935AApr 28, 1992
Reduction of hot carrier effects in semiconductor devices by controlled scattering via the intentional introduction of impurities
TEXAS INSTRUMENTS INC63 citations96
US5087581AFeb 11, 1992
Method of forming vertical FET device with low gate to source overlap capacitance
TEXAS INSTRUMENTS INC83 citations96
US5073519ADec 17, 1991
Method of fabricating a vertical FET device with low gate to drain overlap capacitance
TEXAS INSTRUMENTS INC79 citations96
US4998150AMar 5, 1991
Raised source/drain transistor
TEXAS INSTRUMENTS INC104 citations96
US4877755AOct 31, 1989
Method of forming silicides having different thicknesses
TEXAS INSTRUMENTS INC71 citations96
US6579770B2Jun 17, 2003
Sidewall process and method of implantation for improved CMOS with benefit of low CGD, improved doping profiles, and insensitivity to chemical processing
TEXAS INSTRUMENTS INC24 citations93
US6329225B1Dec 11, 2001
Tight pitch gate devices with enlarged contact areas for deep source and drain terminals and method
TEXAS INSTRUMENTS INC39 citations93
US6326289B1Dec 4, 2001
Method of forming a silicide layer using a pre-amorphization implant which is blocked from source/drain regions by a layer of photoresist
TEXAS INSTRUMENTS INC25 citations93
US6261887B1Jul 17, 2001
Transistors with independently formed gate structures and method
TEXAS INSTRUMENTS INC35 citations93
US6228725B1May 8, 2001
Semiconductor devices with pocket implant and counter doping
TEXAS INSTRUMENTS INC21 citations93
US6160299ADec 12, 2000
Shallow-implant elevated source/drain doping from a sidewall dopant source
TEXAS INSTRUMENTS INC27 citations93
US6093610AJul 25, 2000
Self-aligned pocket process for deep sub-0.1 μm CMOS devices and the device
TEXAS INSTRUMENTS INC43 citations93
US5976937ANov 2, 1999
Transistor having ultrashallow source and drain junctions with reduced gate overlap and method
TEXAS INSTRUMENTS INC37 citations93
US5324961AJun 28, 1994
Stacked capacitor SRAM cell
TEXAS INSTRUMENTS INC33 citations93
US5213990AMay 25, 1993
Method for forming a stacked semiconductor structure
TEXAS INSTRUMENTS INC33 citations93
US5198378AMar 30, 1993
Process of fabricating elevated source/drain transistor
TEXAS INSTRUMENTS INC31 citations93
US5192706AMar 9, 1993
Method for semiconductor isolation
TEXAS INSTRUMENTS INC21 citations93
US5145799ASep 8, 1992
Stacked capacitor SRAM cell
TEXAS INSTRUMENTS INC45 citations93
US5106777AApr 21, 1992
Trench isolation process with reduced topography
TEXAS INSTRUMENTS INC37 citations93
US6686300B2Feb 3, 2004
Sub-critical-dimension integrated circuit features
TEXAS INSTRUMENTS INC33 citations92
US6583013B1Jun 24, 2003
Method for forming a mixed voltage circuit having complementary devices
TEXAS INSTRUMENTS INC24 citations92
US6413824B1Jul 2, 2002
Method to partially or completely suppress pocket implant in selective circuit elements with no additional mask in a cmos flow where separate masking steps are used for the drain extension implants for the low voltage and high voltage transistors
TEXAS INSTRUMENTS INC21 citations92
SAMSUNG ELECTRONICS CO LTD
11 patentsUS10008583B1Jun 26, 2018
Gate-all-around nanosheet field-effect transistors and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD78 citations98
US9287357B2Mar 15, 2016
Integrated circuits with Si and non-Si nanosheet FET co-integration with low band-to-band tunneling and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD66 citations97
US10026652B2Jul 17, 2018
Horizontal nanosheet FETs and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD21 citations94
US9941405B2Apr 10, 2018
Nanosheet and nanowire devices having source/drain stressors and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD25 citations94
US9853114B1Dec 26, 2017
Field effect transistor with stacked nanowire-like channels and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD24 citations94
US9812449B2Nov 7, 2017
Multi-VT gate stack for III-V nanosheet devices with reduced parasitic capacitance
SAMSUNG ELECTRONICS CO LTD30 citations94
US9711414B2Jul 18, 2017
Strained stacked nanosheet FETS and/or quantum well stacked nanosheet
SAMSUNG ELECTRONICS CO LTD32 citations94
US9490323B2Nov 8, 2016
Nanosheet FETs with stacked nanosheets having smaller horizontal spacing than vertical spacing for large effective width
SAMSUNG ELECTRONICS CO LTD37 citations94
US9647098B2May 9, 2017
Thermionically-overdriven tunnel FETs and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD42 citations93
US8828818B1Sep 9, 2014
Methods of fabricating integrated circuit device with fin transistors having different threshold voltages
SAMSUNG ELECTRONICS CO LTD29 citations93
US11461620B2Oct 4, 2022
Multi-bit, SoC-compatible neuromorphic weight cell using ferroelectric FETs
SAMSUNG ELECTRONICS CO LTD5 citations84
OBRADOVIC BORNA J
2 patentsUS9570609B2Feb 14, 2017
Crystalline multiple-nanosheet strained channel FETs and methods of fabricating the same
OBRADOVIC BORNA J56 citations97
US9461114B2Oct 4, 2016
Semiconductor devices with structures for suppression of parasitic bipolar effect in stacked nanosheet FETs and methods of fabricating the same
OBRADOVIC BORNA J43 citations93
WANG WEI-E
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