Inventor · disambiguated record
Yi-Chieh Lai
Also filed as: LAI YI-CHIEH
2 granted patents·1 pending application·2 citations·filing 2004–2024
34Inventor score
Top patents by PatentIndex Score
3 records- 0159US2025390015A1Photomask and method for transferring patternUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 0253US11960203B2Method of forming patterns on substrate by double nanoimprint lithographyUNITED MICROELECTRONICS CORP·Filed 2022·Granted Apr 16, 2024·0 cites·12 claims
- 0350US7141179B2Monitoring semiconductor wafer defects below one nanometerMACRONIX INT CO LTD·Filed 2004·Granted Nov 28, 2006·2 cites·29 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →