Inventor · disambiguated record
Philip V. Kaszuba
Also filed as: KASZUBA PHILIP V
9 granted patents·163 citations·filing 1999–2018
86Inventor score
Top patents by PatentIndex Score
9 records- 0188US7205237B2Apparatus and method for selected site backside unlayering of si, GaAs, GaxAlyAszof SOI technologies for scanning probe microscopy and atomic force probing characterizationIBM·Filed 2005·Granted Apr 17, 2007·15 cites·20 claims
- 0282US6198300B1Silicided silicon microtips for scanning probe microscopyIBM·Filed 1999·Granted Mar 6, 2001·87 cites·16 claims
- 0374US7511510B2Nanoscale fault isolation and measurement systemIBM·Filed 2005·Granted Mar 31, 2009·4 cites·29 claims
- 0472US6139759AMethod of manufacturing silicided silicon microtips for scanning probe microscopyIBM·Filed 1999·Granted Oct 31, 2000·53 cites·17 claims
- 0555US7812347B2Integrated circuit and methods of measurement and preparation of measurement structureIBM·Filed 2008·Granted Oct 12, 2010·2 cites·19 claims
- 0654US7671604B2Nanoscale fault isolation and measurement systemIBM·Filed 2008·Granted Mar 2, 2010·0 cites·16 claims
- 0753US7944550B2System and method for detecting local mechanical stress in integreated devicesIBM·Filed 2008·Granted May 17, 2011·2 cites·25 claims
- 0845US10580615B2System and method for performing failure analysis using virtual three-dimensional imagingGLOBALFOUNDRIES INC·Filed 2018·Granted Mar 3, 2020·0 cites·20 claims
- 0939US7507591B2Methods of measurement and preparation of measurement structure of integrated circuitIBM·Filed 2005·Granted Mar 24, 2009·0 cites·18 claims
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