Inventor · disambiguated record
Yutaka Tandai
Also filed as: TANDAI YUTAKA
6 granted patents·2 pending applications·24 citations·filing 2008–2016
77Inventor score
Top patents by PatentIndex Score
8 records- 0188US8595666B2Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying programHAYAKAWA KOICHI·Filed 2010·Granted Nov 26, 2013·10 cites·24 claims
- 0282US10304654B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted May 28, 2019·3 cites·15 claims
- 0377US8995748B2Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying methodSAKAI TSUNEHIRO·Filed 2010·Granted Mar 31, 2015·7 cites·13 claims
- 0465US9881365B2Semiconductor defect categorization device and program for semiconductor defect categorization deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 30, 2018·2 cites·4 claims
- 0551US8139845B2Evaluation object pattern determining apparatus, evaluation object pattern determining method, evaluation object pattern determining program and pattern evaluating systemNOGUCHI TAKASHI·Filed 2008·Granted Mar 20, 2012·2 cites·11 claims
- 0636US2014177940A1Recipe generation apparatus, inspection support apparatus, inspection system, and recording mediaNAKAGAKI RYO·Filed 2011·Application pending·0 cites
- 0735US10074511B2Defect image classification apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 11, 2018·0 cites·9 claims
- 0830US2011296362A1Semiconductor defect integrated projection method and defect inspection support apparatus equipped with semiconductor defect integrated projection functionISHIKAWA TAMAO·Filed 2010·Application pending·0 cites
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