Inventor
FULFORD JR H JIM
US186 patents
⚠️ This page may combine multiple inventors who share the name “FULFORD JR H JIM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
49 patentsUS6255698B1Jul 3, 2001
Separately optimized gate structures for n-channel and p-channel transistors in an integrated circuit
ADVANCED MICRO DEVICES INC202 citations99
US6111260AAug 29, 2000
Method and apparatus for in situ anneal during ion implant
ADVANCED MICRO DEVICES INC305 citations99
US6093611AJul 25, 2000
Oxide liner for high reliability with reduced encroachment of the source/drain region
ADVANCED MICRO DEVICES INC294 citations99
US5953626ASep 14, 1999
Dissolvable dielectric method
ADVANCED MICRO DEVICES INC160 citations99
US5850105ADec 15, 1998
Substantially planar semiconductor topography using dielectrics and chemical mechanical polish
ADVANCED MICRO DEVICES INC278 citations99
US5793090AAug 11, 1998
Integrated circuit having multiple LDD and/or source/drain implant steps to enhance circuit performance
ADVANCED MICRO DEVICES INC123 citations99
US5789300AAug 4, 1998
Method of making IGFETs in densely and sparsely populated areas of a substrate
ADVANCED MICRO DEVICES INC233 citations99
US5759913AJun 2, 1998
Method of formation of an air gap within a semiconductor dielectric by solvent desorption
ADVANCED MICRO DEVICES INC148 citations99
US6200865B1Mar 13, 2001
Use of sacrificial dielectric structure to form semiconductor device with a self-aligned threshold adjust and overlying low-resistance gate
ADVANCED MICRO DEVICES INC116 citations98
US6060345AMay 9, 2000
Method of making NMOS and PMOS devices with reduced masking steps
ADVANCED MICRO DEVICES INC114 citations98
US5943585AAug 24, 1999
Trench isolation structure having low K dielectric spacers arranged upon an oxide liner incorporated with nitrogen
ADVANCED MICRO DEVICES INC92 citations98
US5930642AJul 27, 1999
Transistor with buried insulative layer beneath the channel region
ADVANCED MICRO DEVICES INC104 citations98
US5918129AJun 29, 1999
Method of channel doping using diffusion from implanted polysilicon
ADVANCED MICRO DEVICES INC110 citations98
US5888880AMar 30, 1999
Trench transistor with localized source/drain regions implanted through selectively grown oxide layer
ADVANCED MICRO DEVICES INC113 citations98
US5885877AMar 23, 1999
Composite gate electrode incorporating dopant diffusion-retarding barrier layer adjacent to underlying gate dielectric
ADVANCED MICRO DEVICES INC107 citations98
US5837572ANov 17, 1998
CMOS integrated circuit formed by using removable spacers to produce asymmetrical NMOS junctions before asymmetrical PMOS junctions for optimizing thermal diffusivity of dopants implanted therein
ADVANCED MICRO DEVICES INC103 citations98
US5827776AOct 27, 1998
Method of making an integrated circuit which uses an etch stop for producing staggered interconnect lines
ADVANCED MICRO DEVICES INC139 citations98
US5792706AAug 11, 1998
Interlevel dielectric with air gaps to reduce permitivity
ADVANCED MICRO DEVICES INC96 citations98
US6259142B1Jul 10, 2001
Multiple split gate semiconductor device and fabrication method
ADVANCED MICRO DEVICES INC67 citations96
US6258680B1Jul 10, 2001
Integrated circuit gate conductor which uses layered spacers to produce a graded junction
ADVANCED MICRO DEVICES INC67 citations96
US6225151B1May 1, 2001
Nitrogen liner beneath transistor source/drain regions to retard dopant diffusion
ADVANCED MICRO DEVICES INC68 citations96
US6208015B1Mar 27, 2001
Interlevel dielectric with air gaps to lessen capacitive coupling
ADVANCED MICRO DEVICES INC51 citations96
US6201278B1Mar 13, 2001
Trench transistor with insulative spacers
ADVANCED MICRO DEVICES INC48 citations96
US6187620B1Feb 13, 2001
Integrated circuit having sacrificial spacers for producing graded NMOS source/drain junctions possibly dissimilar from PMOS source/drain junctions
ADVANCED MICRO DEVICES INC54 citations96
US6157081ADec 5, 2000
High-reliability damascene interconnect formation for semiconductor fabrication
ADVANCED MICRO DEVICES INC83 citations96
US6144071ANov 7, 2000
Ultrathin silicon nitride containing sidewall spacers for improved transistor performance
ADVANCED MICRO DEVICES INC54 citations96
US6118137ASep 12, 2000
Test structure responsive to electrical signals for determining lithographic misalignment of conductors relative to vias
ADVANCED MICRO DEVICES INC70 citations96
US6107129AAug 22, 2000
Integrated circuit having multiple LDD and/or source/drain implant steps to enhance circuit performance
ADVANCED MICRO DEVICES INC50 citations96
US6100173AAug 8, 2000
Forming a self-aligned silicide gate conductor to a greater thickness than junction silicide structures using a dual-salicidation process
ADVANCED MICRO DEVICES INC68 citations96
US5998288ADec 7, 1999
Ultra thin spacers formed laterally adjacent a gate conductor recessed below the upper surface of a substrate
ADVANCED MICRO DEVICES INC75 citations96
US5943550AAug 24, 1999
Method of processing a semiconductor wafer for controlling drive current
ADVANCED MICRO DEVICES INC71 citations96
US5930634AJul 27, 1999
Method of making an IGFET with a multilevel gate
ADVANCED MICRO DEVICES INC63 citations96
US5926713AJul 20, 1999
Method for achieving global planarization by forming minimum mesas in large field areas
ADVANCED MICRO DEVICES INC69 citations96
US5899732AMay 4, 1999
Method of implanting silicon through a polysilicon gate for punchthrough control of a semiconductor device
ADVANCED MICRO DEVICES INC83 citations96
US5899727AMay 4, 1999
Method of making a semiconductor isolation region bounded by a trench and covered with an oxide to improve planarization
ADVANCED MICRO DEVICES INC56 citations96
US5888675AMar 30, 1999
Reticle that compensates for radiation-induced lens error in a photolithographic system
ADVANCED MICRO DEVICES INC68 citations96
US5882973AMar 16, 1999
Method for forming an integrated circuit having transistors of dissimilarly graded junction profiles
ADVANCED MICRO DEVICES INC83 citations96
US5874346AFeb 23, 1999
Subtrench conductor formation with large tilt angle implant
ADVANCED MICRO DEVICES INC44 citations96
US5847428ADec 8, 1998
Integrated circuit gate conductor which uses layered spacers to produce a graded junction
ADVANCED MICRO DEVICES INC76 citations96
US5840451ANov 24, 1998
Individually controllable radiation sources for providing an image pattern in a photolithographic system
ADVANCED MICRO DEVICES INC61 citations96
US5814555ASep 29, 1998
Interlevel dielectric with air gaps to lessen capacitive coupling
ADVANCED MICRO DEVICES INC63 citations96
US5793089AAug 11, 1998
Graded MOS transistor junction formed by aligning a sequence of implants to a selectively removable polysilicon sidewall space and oxide thermally grown thereon
ADVANCED MICRO DEVICES INC82 citations96
US5783864AJul 21, 1998
Multilevel interconnect structure of an integrated circuit having air gaps and pillars separating levels of interconnect
ADVANCED MICRO DEVICES INC78 citations96
US5766969AJun 16, 1998
Multiple spacer formation/removal technique for forming a graded junction
ADVANCED MICRO DEVICES INC48 citations96
US5710054AJan 20, 1998
Method of forming a shallow junction by diffusion from a silicon-based spacer
ADVANCED MICRO DEVICES INC92 citations96
US5445975AAug 29, 1995
Semiconductor wafer with enhanced pre-process denudation and process-induced gettering
ADVANCED MICRO DEVICES INC88 citations96
US5904517AMay 18, 1999
Ultra thin high K spacer material for use in transistor fabrication
ADVANCED MICRO DEVICES INC60 citations95
US5801076ASep 1, 1998
Method of making non-volatile memory device having a floating gate with enhanced charge retention
ADVANCED MICRO DEVICES INC67 citations94
US5591681AJan 7, 1997
Method for achieving a highly reliable oxide film
ADVANCED MICRO DEVICES INC71 citations94
ADVANCED MICRO DEVCIES INC
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