P

Inventor

FULFORD JR H JIM

US186 patents
⚠️ This page may combine multiple inventors who share the name “FULFORD JR H JIM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED MICRO DEVICES INC

49 patents
US6255698B1Jul 3, 2001

Separately optimized gate structures for n-channel and p-channel transistors in an integrated circuit

ADVANCED MICRO DEVICES INC202 citations99
US6111260AAug 29, 2000

Method and apparatus for in situ anneal during ion implant

ADVANCED MICRO DEVICES INC305 citations99
US6093611AJul 25, 2000

Oxide liner for high reliability with reduced encroachment of the source/drain region

ADVANCED MICRO DEVICES INC294 citations99
US5953626ASep 14, 1999

Dissolvable dielectric method

ADVANCED MICRO DEVICES INC160 citations99
US5850105ADec 15, 1998

Substantially planar semiconductor topography using dielectrics and chemical mechanical polish

ADVANCED MICRO DEVICES INC278 citations99
US5793090AAug 11, 1998

Integrated circuit having multiple LDD and/or source/drain implant steps to enhance circuit performance

ADVANCED MICRO DEVICES INC123 citations99
US5789300AAug 4, 1998

Method of making IGFETs in densely and sparsely populated areas of a substrate

ADVANCED MICRO DEVICES INC233 citations99
US5759913AJun 2, 1998

Method of formation of an air gap within a semiconductor dielectric by solvent desorption

ADVANCED MICRO DEVICES INC148 citations99
US6200865B1Mar 13, 2001

Use of sacrificial dielectric structure to form semiconductor device with a self-aligned threshold adjust and overlying low-resistance gate

ADVANCED MICRO DEVICES INC116 citations98
US6060345AMay 9, 2000

Method of making NMOS and PMOS devices with reduced masking steps

ADVANCED MICRO DEVICES INC114 citations98
US5943585AAug 24, 1999

Trench isolation structure having low K dielectric spacers arranged upon an oxide liner incorporated with nitrogen

ADVANCED MICRO DEVICES INC92 citations98
US5930642AJul 27, 1999

Transistor with buried insulative layer beneath the channel region

ADVANCED MICRO DEVICES INC104 citations98
US5918129AJun 29, 1999

Method of channel doping using diffusion from implanted polysilicon

ADVANCED MICRO DEVICES INC110 citations98
US5888880AMar 30, 1999

Trench transistor with localized source/drain regions implanted through selectively grown oxide layer

ADVANCED MICRO DEVICES INC113 citations98
US5885877AMar 23, 1999

Composite gate electrode incorporating dopant diffusion-retarding barrier layer adjacent to underlying gate dielectric

ADVANCED MICRO DEVICES INC107 citations98
US5837572ANov 17, 1998

CMOS integrated circuit formed by using removable spacers to produce asymmetrical NMOS junctions before asymmetrical PMOS junctions for optimizing thermal diffusivity of dopants implanted therein

ADVANCED MICRO DEVICES INC103 citations98
US5827776AOct 27, 1998

Method of making an integrated circuit which uses an etch stop for producing staggered interconnect lines

ADVANCED MICRO DEVICES INC139 citations98
US5792706AAug 11, 1998

Interlevel dielectric with air gaps to reduce permitivity

ADVANCED MICRO DEVICES INC96 citations98
US6259142B1Jul 10, 2001

Multiple split gate semiconductor device and fabrication method

ADVANCED MICRO DEVICES INC67 citations96
US6258680B1Jul 10, 2001

Integrated circuit gate conductor which uses layered spacers to produce a graded junction

ADVANCED MICRO DEVICES INC67 citations96
US6225151B1May 1, 2001

Nitrogen liner beneath transistor source/drain regions to retard dopant diffusion

ADVANCED MICRO DEVICES INC68 citations96
US6208015B1Mar 27, 2001

Interlevel dielectric with air gaps to lessen capacitive coupling

ADVANCED MICRO DEVICES INC51 citations96
US6201278B1Mar 13, 2001

Trench transistor with insulative spacers

ADVANCED MICRO DEVICES INC48 citations96
US6187620B1Feb 13, 2001

Integrated circuit having sacrificial spacers for producing graded NMOS source/drain junctions possibly dissimilar from PMOS source/drain junctions

ADVANCED MICRO DEVICES INC54 citations96
US6157081ADec 5, 2000

High-reliability damascene interconnect formation for semiconductor fabrication

ADVANCED MICRO DEVICES INC83 citations96
US6144071ANov 7, 2000

Ultrathin silicon nitride containing sidewall spacers for improved transistor performance

ADVANCED MICRO DEVICES INC54 citations96
US6118137ASep 12, 2000

Test structure responsive to electrical signals for determining lithographic misalignment of conductors relative to vias

ADVANCED MICRO DEVICES INC70 citations96
US6107129AAug 22, 2000

Integrated circuit having multiple LDD and/or source/drain implant steps to enhance circuit performance

ADVANCED MICRO DEVICES INC50 citations96
US6100173AAug 8, 2000

Forming a self-aligned silicide gate conductor to a greater thickness than junction silicide structures using a dual-salicidation process

ADVANCED MICRO DEVICES INC68 citations96
US5998288ADec 7, 1999

Ultra thin spacers formed laterally adjacent a gate conductor recessed below the upper surface of a substrate

ADVANCED MICRO DEVICES INC75 citations96
US5943550AAug 24, 1999

Method of processing a semiconductor wafer for controlling drive current

ADVANCED MICRO DEVICES INC71 citations96
US5930634AJul 27, 1999

Method of making an IGFET with a multilevel gate

ADVANCED MICRO DEVICES INC63 citations96
US5926713AJul 20, 1999

Method for achieving global planarization by forming minimum mesas in large field areas

ADVANCED MICRO DEVICES INC69 citations96
US5899732AMay 4, 1999

Method of implanting silicon through a polysilicon gate for punchthrough control of a semiconductor device

ADVANCED MICRO DEVICES INC83 citations96
US5899727AMay 4, 1999

Method of making a semiconductor isolation region bounded by a trench and covered with an oxide to improve planarization

ADVANCED MICRO DEVICES INC56 citations96
US5888675AMar 30, 1999

Reticle that compensates for radiation-induced lens error in a photolithographic system

ADVANCED MICRO DEVICES INC68 citations96
US5882973AMar 16, 1999

Method for forming an integrated circuit having transistors of dissimilarly graded junction profiles

ADVANCED MICRO DEVICES INC83 citations96
US5874346AFeb 23, 1999

Subtrench conductor formation with large tilt angle implant

ADVANCED MICRO DEVICES INC44 citations96
US5847428ADec 8, 1998

Integrated circuit gate conductor which uses layered spacers to produce a graded junction

ADVANCED MICRO DEVICES INC76 citations96
US5840451ANov 24, 1998

Individually controllable radiation sources for providing an image pattern in a photolithographic system

ADVANCED MICRO DEVICES INC61 citations96
US5814555ASep 29, 1998

Interlevel dielectric with air gaps to lessen capacitive coupling

ADVANCED MICRO DEVICES INC63 citations96
US5793089AAug 11, 1998

Graded MOS transistor junction formed by aligning a sequence of implants to a selectively removable polysilicon sidewall space and oxide thermally grown thereon

ADVANCED MICRO DEVICES INC82 citations96
US5783864AJul 21, 1998

Multilevel interconnect structure of an integrated circuit having air gaps and pillars separating levels of interconnect

ADVANCED MICRO DEVICES INC78 citations96
US5766969AJun 16, 1998

Multiple spacer formation/removal technique for forming a graded junction

ADVANCED MICRO DEVICES INC48 citations96
US5710054AJan 20, 1998

Method of forming a shallow junction by diffusion from a silicon-based spacer

ADVANCED MICRO DEVICES INC92 citations96
US5445975AAug 29, 1995

Semiconductor wafer with enhanced pre-process denudation and process-induced gettering

ADVANCED MICRO DEVICES INC88 citations96
US5904517AMay 18, 1999

Ultra thin high K spacer material for use in transistor fabrication

ADVANCED MICRO DEVICES INC60 citations95
US5801076ASep 1, 1998

Method of making non-volatile memory device having a floating gate with enhanced charge retention

ADVANCED MICRO DEVICES INC67 citations94
US5591681AJan 7, 1997

Method for achieving a highly reliable oxide film

ADVANCED MICRO DEVICES INC71 citations94

ADVANCED MICRO DEVCIES INC

1 patent

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