Inventor
SEKINO TAKASHI
JP30 patents
⚠️ This page may combine multiple inventors who share the name “SEKINO TAKASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
27 patentsUS6294949B1Sep 25, 2001
Voltage drive circuit, voltage drive apparatus and semiconductor-device testing apparatus
ADVANTEST CORP23 citations92
US5225775AJul 6, 1993
Ic testing device for permitting adjustment of timing of a test signal
ADVANTEST CORP50 citations92
US7876120B2Jan 25, 2011
Test apparatus, pin electronics card, electrical device and switch
ADVANTEST CORP16 citations84
US7512872B2Mar 31, 2009
Test apparatus and test method
ADVANTEST CORP9 citations84
US7394238B2Jul 1, 2008
High frequency delay circuit and test apparatus
ADVANTEST CORP9 citations84
US7013230B2Mar 14, 2006
Input-output circuit and a testing apparatus
ADVANTEST CORP18 citations84
US7589549B2Sep 15, 2009
Driver circuit and test apparatus
ADVANTEST CORP9 citations81
US6678478B1Jan 13, 2004
Correcting method of optical signal transmission system and optical signal transmission system using said correcting method
ADVANTEST CORP9 citations74
US6462598B1Oct 8, 2002
Delay time control circuit
ADVANTEST CORP10 citations74
US5869992AFeb 9, 1999
Delay time control circuit
ADVANTEST CORP10 citations74
US7707484B2Apr 27, 2010
Test apparatus and test method with features of adjusting phase difference between data and reference clock and acquiring adjusted data
ADVANTEST CORP7 citations73
US7557561B2Jul 7, 2009
Electronic device, circuit and test apparatus
ADVANTEST CORP7 citations73
US5821529AOct 13, 1998
Measuring board having an optically driven switch and I/O terminal testing system using the same
ADVANTEST CORP15 citations73
US7990177B2Aug 2, 2011
Driver circuit for producing signal simulating transmission loss
ADVANTEST CORP3 citations63
US7808291B2Oct 5, 2010
Jitter generating circuit
ADVANTEST CORP3 citations63
US7800912B2Sep 21, 2010
Signal transfer system, signal output circuit board, signal receiving circuit board, signal output method, and signal receiving method
ADVANTEST CORP3 citations63
US7692441B2Apr 6, 2010
Test apparatus and pin electronics card
ADVANTEST CORP4 citations63
US7679390B2Mar 16, 2010
Test apparatus and pin electronics card
ADVANTEST CORP3 citations63
US7528637B2May 5, 2009
Driver circuit
ADVANTEST CORP3 citations63
US7453932B2Nov 18, 2008
Test device and setting method
ADVANTEST CORP4 citations62
US7123025B2Oct 17, 2006
Differential comparator circuit, test head, and test apparatus
ADVANTEST CORP2 citations62
US7342407B2Mar 11, 2008
Temperature compensation circuit and testing apparatus
ADVANTEST CORP3 citations61
US7755377B2Jul 13, 2010
Driver circuit and test apparatus
ADVANTEST CORP5 citations60
US7538582B2May 26, 2009
Driver circuit, test apparatus and adjusting method
ADVANTEST CORP0 citations52
US7459897B2Dec 2, 2008
Terminator circuit, test apparatus, test head, and communication device
ADVANTEST CORP1 citations51
US7962110B2Jun 14, 2011
Driver circuit and test apparatus
ADVANTEST CORP0 citations49
US7902835B2Mar 8, 2011
Transmission line driving circuit
ADVANTEST CORP0 citations42