Inventor
VANDERVORST WILFRIED
BE27 patents
⚠️ This page may combine multiple inventors who share the name “VANDERVORST WILFRIED”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IMEC VZW
11 patentsUS6328902B1Dec 11, 2001
Probe tip configuration and a method of fabrication thereof
IMEC VZW54 citations96
US5723981AMar 3, 1998
Method for measuring the electrical potential in a semiconductor element
IMEC VZW73 citations94
US6504152B2Jan 7, 2003
Probe tip configuration and a method of fabrication thereof
IMEC VZW42 citations92
US6091248AJul 18, 2000
Method for measuring the electrical potential in a semiconductor element
IMEC VZW43 citations90
US5995912ANov 30, 1999
Database and method for measurement correction for cross-sectional carrier profiling techniques
IMEC VZW22 citations87
US10746759B2Aug 18, 2020
Method for determining the shape of a sample tip for atom probe tomography
IMEC VZW2 citations66
US11125805B2Sep 21, 2021
Device for measuring surface characteristics of a material
IMEC VZW0 citations45
US10541108B2Jan 21, 2020
Method and apparatus for transmission electron microscopy
IMEC VZW0 citations45
US11549963B2Jan 10, 2023
Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample
IMEC VZW0 citations41
US10014178B2Jul 3, 2018
Method for differential heating of elongate nano-scaled structures
IMEC VZW0 citations38
US10495666B2Dec 3, 2019
Device and method for two dimensional active carrier profiling of semiconductor components
IMEC VZW0 citations31
IMEC
6 patentsUS7598482B1Oct 6, 2009
Wavelength-sensitive detector with elongate nanostructures
IMEC85 citations97
US6201401B1Mar 13, 2001
Method for measuring the electrical potential in a semiconductor element
IMEC50 citations90
US9612258B2Apr 4, 2017
Probe configuration and method of fabrication thereof
IMEC5 citations68
US8872230B2Oct 28, 2014
Tunnel field-effect transistor and methods for manufacturing thereof
IMEC0 citations51
US9588137B2Mar 7, 2017
Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-up
IMEC1 citations47
US8717570B2May 6, 2014
Method for determining the active doping concentration of a doped semiconductor region
IMEC0 citations38
IMEC INTER UNI MICRO ELECTR
6 patentsUS6690008B2Feb 10, 2004
Probe and method of manufacturing mounted AFM probes
IMEC INTER UNI MICRO ELECTR46 citations92
US6809317B2Oct 26, 2004
Method and apparatus for local surface analysis
IMEC INTER UNI MICRO ELECTR15 citations84
US6756584B2Jun 29, 2004
Probe tip and method of manufacturing probe tips by peel-off
IMEC INTER UNI MICRO ELECTR14 citations84
US5369372ANov 29, 1994
Method for resistance measurements on a semiconductor element with controlled probe pressure
IMEC INTER UNI MICRO ELECTR3 citations62
US7133128B2Nov 7, 2006
System and method for measuring properties of a semiconductor substrate in a non-destructive way
IMEC INTER UNI MICRO ELECTR6 citations60
US6823723B2Nov 30, 2004
Method and apparatus for performing atomic force microscopy measurements
IMEC INTER UNI MICRO ELECTR6 citations57