Inventor · disambiguated record
Daniel Kost
Also filed as: KOST DANIEL
3 granted patents·16 citations·filing 2009–2016
63Inventor score
Top patents by PatentIndex Score
3 records- 0175US8849615B2Method and system for semiconductor process control and monitoring by using a data quality metricKOST DANIEL·Filed 2010·Granted Sep 30, 2014·9 cites·20 claims
- 0271US8103478B2Method and system for semiconductor process control and monitoring by using PCA models of reduced sizeGOOD RICHARD·Filed 2009·Granted Jan 24, 2012·7 cites·20 claims
- 0339US10289109B2Methods of error detection in fabrication processesGLOBALFOUNDRIES INC·Filed 2016·Granted May 14, 2019·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →