P

Inventor

BAINS KULJIT S

US179 patents
⚠️ This page may combine multiple inventors who share the name “BAINS KULJIT S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

42 patents
US9384821B2Jul 5, 2016

Row hammer monitoring based on stored row hammer threshold value

INTEL CORP106 citations99
US9032141B2May 12, 2015

Row hammer monitoring based on stored row hammer threshold value

INTEL CORP151 citations99
US10210925B2Feb 19, 2019

Row hammer refresh command

INTEL CORP75 citations98
US10083737B2Sep 25, 2018

Row hammer monitoring based on stored row hammer threshold value

INTEL CORP79 citations98
US9934143B2Apr 3, 2018

Mapping a physical address differently to different memory devices in a group

INTEL CORP77 citations98
US9865326B2Jan 9, 2018

Row hammer refresh command

INTEL CORP83 citations98
US9747971B2Aug 29, 2017

Row hammer refresh command

INTEL CORP84 citations98
US9299400B2Mar 29, 2016

Distributed row hammer tracking

INTEL CORP72 citations98
US9286964B2Mar 15, 2016

Method, apparatus and system for responding to a row hammer event

INTEL CORP88 citations98
US7281079B2Oct 9, 2007

Method and apparatus to counter mismatched burst lengths

INTEL CORP78 citations98
US5701438ADec 23, 1997

Logical relocation of memory based on memory device type

INTEL CORP132 citations98
US7432731B2Oct 7, 2008

Method and apparatus to calibrate DRAM on resistance (Ron) and on-die termination (ODT) values over process, voltage and temperature (PVT) variations

INTEL CORP67 citations97
US7386765B2Jun 10, 2008

Memory device having error checking and correction

INTEL CORP72 citations97
US6996749B1Feb 7, 2006

Method and apparatus for providing debug functionality in a buffered memory channel

INTEL CORP48 citations95
US10872011B2Dec 22, 2020

Internal error checking and correction (ECC) with extra system bits

INTEL CORP27 citations94
US10810079B2Oct 20, 2020

Memory device error check and scrub mode and error transparency

INTEL CORP26 citations94
US10127101B2Nov 13, 2018

Memory device error check and scrub mode and error transparency

INTEL CORP29 citations94
US9780782B2Oct 3, 2017

On-die termination control without a dedicated pin in a multi-rank system

INTEL CORP34 citations94
US10141935B2Nov 27, 2018

Programmable on-die termination timing in a multi-rank system

INTEL CORP22 citations93
US9842021B2Dec 12, 2017

Memory device check bit read mode

INTEL CORP13 citations93
US9817714B2Nov 14, 2017

Memory device on-die error checking and correcting code

INTEL CORP24 citations93
US9761298B2Sep 12, 2017

Method, apparatus and system for responding to a row hammer event

INTEL CORP15 citations93
US9721643B2Aug 1, 2017

Row hammer monitoring based on stored row hammer threshold value

INTEL CORP20 citations93
US7774684B2Aug 10, 2010

Reliability, availability, and serviceability in a memory device

INTEL CORP30 citations93
US6269443B1Jul 31, 2001

Method and apparatus for automatically selecting CPU clock frequency multiplier

INTEL CORP20 citations93
US7872892B2Jan 18, 2011

Identifying and accessing individual memory devices in a memory channel

INTEL CORP21 citations92
US7412627B2Aug 12, 2008

Method and apparatus for providing debug functionality in a buffered memory channel

INTEL CORP16 citations92
US7353329B2Apr 1, 2008

Memory buffer device integrating refresh logic

INTEL CORP21 citations92
US5740385AApr 14, 1998

Low load host/PCI bus bridge

INTEL CORP22 citations92
US6112284AAug 29, 2000

Method and apparatus for latching data from a memory resource at a datapath unit

INTEL CORP36 citations89
US5678009AOct 14, 1997

Method and apparatus providing fast access to a shared resource on a computer bus

INTEL CORP46 citations89
US11314589B2Apr 26, 2022

Read retry to selectively disable on-die ECC

INTEL CORP8 citations86
US10496473B2Dec 3, 2019

Extracting selective information from on-die dynamic random access memory (DRAM) error correction code (ECC)

INTEL CORP11 citations84
US10490239B2Nov 26, 2019

Programmable data pattern for repeated writes to memory

INTEL CORP9 citations84
US10224090B2Mar 5, 2019

Directed per bank refresh command

INTEL CORP4 citations84
US10146711B2Dec 4, 2018

Techniques to access or operate a dual in-line memory module via multiple data channels

INTEL CORP14 citations84
US10108512B2Oct 23, 2018

Validation of memory on-die error correction code

INTEL CORP12 citations84
US9870325B2Jan 16, 2018

Common die implementation for memory devices with independent interface paths

INTEL CORP13 citations84
US9811420B2Nov 7, 2017

Extracting selective information from on-die dynamic random access memory (DRAM) error correction code (ECC)

INTEL CORP7 citations84
US9804793B2Oct 31, 2017

Techniques for a write zero operation

INTEL CORP7 citations84
US9721641B2Aug 1, 2017

Apparatus, method and system for memory device access with a multi-cycle command

INTEL CORP9 citations84
US9691468B2Jun 27, 2017

Directed per bank refresh command

INTEL CORP4 citations84

BAINS KULJIT S

4 patents

MCCALL JAMES A

2 patents

GREENFIELD ZVIKA

1 patent

MACWILLIAMS PETER

1 patent

Showing the top 50 of 179 patents by PatentIndex Score.