Inventor
AJIMA MASAHIKO
JP17 patents
⚠️ This page may combine multiple inventors who share the name “AJIMA MASAHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
16 patentsUSD633538SMar 1, 2011
Electron microscope
HITACHI HIGH TECH CORP18 citations92
USD633537SMar 1, 2011
Electron microscope
HITACHI HIGH TECH CORP17 citations92
USD632323SFeb 8, 2011
Electron microscope
HITACHI HIGH TECH CORP17 citations92
USD626579SNov 2, 2010
Electron microscope
HITACHI HIGH TECH CORP17 citations92
USD625749SOct 19, 2010
Electron microscope
HITACHI HIGH TECH CORP18 citations92
USD623211SSep 7, 2010
Electron microscope
HITACHI HIGH TECH CORP18 citations92
USD730962SJun 2, 2015
Base of a thin membrane holder for an electron microscope
HITACHI HIGH TECH CORP6 citations83
USD635167SMar 29, 2011
Portion of an electron microscope
HITACHI HIGH TECH CORP5 citations62
USD635168SMar 29, 2011
Portion of an electron microscope
HITACHI HIGH TECH CORP5 citations62
US11221280B2Jan 11, 2022
Method of preparing biological tissue sample and method of observing biological tissue section sample
HITACHI HIGH TECH CORP0 citations60
USD731570SJun 9, 2015
Thin membrane holder for an electron microscope
HITACHI HIGH TECH CORP2 citations57
US9633817B2Apr 25, 2017
Diaphragm mounting member and charged particle beam device
HITACHI HIGH TECH CORP1 citations51
US9373480B2Jun 21, 2016
Charged particle beam device and filter member
HITACHI HIGH TECH CORP0 citations41
US9263232B2Feb 16, 2016
Charged particle beam device
HITACHI HIGH TECH CORP0 citations41
US9251996B2Feb 2, 2016
Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig
HITACHI HIGH TECH CORP0 citations41
US9240305B2Jan 19, 2016
Charged particle beam device and sample observation method
HITACHI HIGH TECH CORP0 citations41