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Portion of an electron microscope

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Assignee: HITACHI HIGH TECH CORPPriority: Sep 25, 2009Filed: Mar 2, 2010Granted: Mar 29, 2011
Est. expirySep 25, 2029(~3.2 yrs left)· nominal 20-yr term from priority
44
PatentIndex Score
5
Cited by
17
References
1
Claims

Claims

exact text as granted — not AI-modified
We claim the ornamental design for a portion of an electron microscope, as shown and described.

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