Inventor · disambiguated record
Tomohisa Ohtaki
Also filed as: OHTAKI TOMOHISA
22 granted patents·1 pending application·142 citations·filing 2006–2018
94Inventor score
Top patents by PatentIndex Score
23 records- 0193US8710439B2Charged particle beam apparatusOMINAMI YUSUKE·Filed 2012·Granted Apr 29, 2014·15 cites·23 claims
- 0283US8933400B2Inspection or observation apparatus and sample inspection or observation methodOMINAMI YUSUKE·Filed 2012·Granted Jan 13, 2015·5 cites·13 claims
- 0381US8921786B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 30, 2014·3 cites·20 claims
- 0473USD625749SElectron microscopeHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 19, 2010·18 cites·1 claims
- 0573USD623211SElectron microscopeHITACHI HIGH TECH CORP·Filed 2009·Granted Sep 7, 2010·18 cites·1 claims
- 0672USD633538SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 1, 2011·18 cites·1 claims
- 0771USD633537SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 1, 2011·17 cites·1 claims
- 0870USD632323SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Feb 8, 2011·17 cites·1 claims
- 0970USD626579SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Nov 2, 2010·17 cites·1 claims
- 1069US7365323B2Environmental scanning electron microcopeHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 29, 2008·3 cites·7 claims
- 1162US9105442B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 11, 2015·0 cites·17 claims
- 1260US9236217B2Inspection or observation apparatus and sample inspection or observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 12, 2016·0 cites·3 claims
- 1358US11391756B2Probe module and probeHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 19, 2022·0 cites·13 claims
- 1454US9165741B2Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sampleOMINAMI YUSUKE·Filed 2012·Granted Oct 20, 2015·0 cites·18 claims
- 1553US9673020B2Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sampleHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 6, 2017·0 cites·16 claims
- 1650US8921784B2Scanning electron microscopeIWAYA TORU·Filed 2010·Granted Dec 30, 2014·1 cites·6 claims
- 1749US2009057558A1Scanning electron microscopeHIGH TECHNOLOGIES CORP·Filed 2008·Application pending·0 cites
- 1846US11709199B2Evaluation apparatus for semiconductor deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 25, 2023·0 cites·5 claims
- 1945US9263232B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 16, 2016·0 cites·15 claims
- 2044USD635168SPortion of an electron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 29, 2011·5 cites·1 claims
- 2144USD635167SPortion of an electron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 29, 2011·5 cites·1 claims
- 2243US11977099B2Method for manufacturing semiconductor deviceHITACHI HIGH TECH CORP·Filed 2018·Granted May 7, 2024·0 cites·7 claims
- 2339US8809782B2Scanning electron microscopeOHTAKI TOMOHISA·Filed 2010·Granted Aug 19, 2014·0 cites·14 claims
Join the waitlist — get patent alerts
Get an alert when Tomohisa Ohtaki files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →