Inventor · disambiguated record
Kazunari Suga
Also filed as: SUGA KAZUNARI
11 granted patents·1 pending application·319 citations·filing 1995–2019
90Inventor score
Top patents by PatentIndex Score
12 records- 0193US6052284APrinted circuit board with electronic devices mounted thereonADVANTEST CORP·Filed 1997·Granted Apr 18, 2000·166 cites·31 claims
- 0279US7397258B2Burn-in system with heating blocks accommodated in cooling blocksADVANTEST CORP·Filed 2005·Granted Jul 8, 2008·10 cites·8 claims
- 0378US11460520B2Sensor test systemADVANTEST CORP·Filed 2019·Granted Oct 4, 2022·2 cites·10 claims
- 0475US5754057AContact mechanism for test head of semiconductor test systemADVANTEST CORP·Filed 1996·Granted May 19, 1998·49 cites·6 claims
- 0574US5818219ASemiconductor test system having test head connection apparatusADVANTEST CORP·Filed 1995·Granted Oct 6, 1998·38 cites·8 claims
- 0665US7554350B2Burn-in system with heating blocks accommodated in cooling blocksADVANTEST CORP·Filed 2008·Granted Jun 30, 2009·4 cites·17 claims
- 0765US5747994ABoard exchange mechanism for semiconductor test systemADVANTEST CORP·Filed 1996·Granted May 5, 1998·34 cites·1 claims
- 0849US11614350B2Sensor test apparatusADVANTEST CORP·Filed 2019·Granted Mar 28, 2023·0 cites·16 claims
- 0945US11693049B2Sensor test apparatusADVANTEST CORP·Filed 2019·Granted Jul 4, 2023·0 cites·13 claims
- 1043US2009230985A1Burn-in system with measurement block accomodated in cooling blockADVANTEST CORP·Filed 2009·Application pending·0 cites
- 1141US6292005B1Probe card for IC testing apparatusADVANTEST CORPORATIN·Filed 1999·Granted Sep 18, 2001·12 cites·4 claims
- 1232US6184697B1Semiconductor integrated circuit testing apparatus with reduced installation areaADVANTEST CORP·Filed 1997·Granted Feb 6, 2001·4 cites·11 claims
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