Inventor
HALVORSON BRIAN
US7 patents
Patents
7 patentsUS9261537B2Feb 16, 2016
Wafer level integrated circuit contactor and method of construction
JOHNSTECH INT CORP13 citations80
US10078101B2Sep 18, 2018
Wafer level integrated circuit probe array and method of construction
JOHNSTECH INT CORP4 citations69
US9817026B2Nov 14, 2017
Wafer level integrated circuit contactor and method of construction
JOHNSTECH INT CORP5 citations69
US9696347B2Jul 4, 2017
Testing apparatus and method for microcircuit and wafer level IC testing
JOHNSTECH INT CORP2 citations66
US10928423B2Feb 23, 2021
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
JOHNSTECH INT CORP0 citations56
US10330702B2Jun 25, 2019
Wafer level integrated circuit probe array and method of construction
JOHNSTECH INT CORP0 citations48
US10067164B2Sep 4, 2018
Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings
JOHNSTECH INT CORP0 citations45