Inventor
JIN XIANKUN
US16 patents
⚠️ This page may combine multiple inventors who share the name “JIN XIANKUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NXP USA INC
10 patentsUS10505519B1Dec 10, 2019
Dynamic comparator
NXP USA INC18 citations85
US11585849B2Feb 21, 2023
Apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereof
NXP USA INC2 citations73
US11728336B2Aug 15, 2023
Compensated alternating polarity capacitive structures
NXP USA INC2 citations72
US10770457B2Sep 8, 2020
Compensated alternating polarity capacitive structures
NXP USA INC3 citations72
US10359469B2Jul 23, 2019
Non-intrusive on-chip analog test/trim/calibrate subsystem
NXP USA INC2 citations72
US10345841B1Jul 9, 2019
Current source with variable resistor circuit
NXP USA INC4 citations72
US11561255B2Jan 24, 2023
Systems and methods for detecting faults in an analog input/output circuitry
NXP USA INC1 citations62
US11961577B2Apr 16, 2024
Testing of on-chip analog-mixed signal circuits using on-chip memory
NXP USA INC0 citations50
US10816595B2Oct 27, 2020
Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereof
NXP USA INC0 citations41
US10474553B2Nov 12, 2019
Built-in self test for A/D converter
NXP USA INC0 citations31
FREESCALE SEMICONDUCTOR INC
3 patentsUS9319033B1Apr 19, 2016
Ramp voltage generator and method for testing an analog-to-digital converter
FREESCALE SEMICONDUCTOR INC21 citations92
US9473164B1Oct 18, 2016
Method for testing analog-to-digital converter and system therefor
FREESCALE SEMICONDUCTOR INC9 citations83
US9438262B1Sep 6, 2016
Method for testing differential analog-to-digital converter and system therefor
FREESCALE SEMICONDUCTOR INC4 citations73