Inventor
KIM CHAN-KYUNG
KR51 patents
⚠️ This page may combine multiple inventors who share the name “KIM CHAN-KYUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
36 patentsUS7078955B2Jul 18, 2006
Temperature sensing circuit and method
SAMSUNG ELECTRONICS CO LTD55 citations96
US10446207B2Oct 15, 2019
Spin transfer torque magnetic random access memory for supporting operational modes with mode register
SAMSUNG ELECTRONICS CO LTD36 citations93
US7581881B2Sep 1, 2009
Temperature sensor using ring oscillator and temperature detection method using the same
SAMSUNG ELECTRONICS CO LTD36 citations93
US7501870B2Mar 10, 2009
Duty cycle correction circuit and duty cycle correction method
SAMSUNG ELECTRONICS CO LTD36 citations92
US10475774B2Nov 12, 2019
Semiconductor package
SAMSUNG ELECTRONICS CO LTD5 citations84
US7683726B2Mar 23, 2010
Quadrature-phase voltage controlled oscillator
SAMSUNG ELECTRONICS CO LTD12 citations84
US6903589B2Jun 7, 2005
Output driver circuit with automatic slew rate control and slew rate control method using the same
SAMSUNG ELECTRONICS CO LTD15 citations84
US10416896B2Sep 17, 2019
Memory module, memory device, and processing device having a processor mode, and memory system
SAMSUNG ELECTRONICS CO LTD11 citations83
US10204670B2Feb 12, 2019
Spin transfer torque magnetic random access memory for supporting operational modes with mode register
SAMSUNG ELECTRONICS CO LTD13 citations83
US7227808B2Jun 5, 2007
Semiconductor memory device which compensates for delay time variations of multi-bit data
SAMSUNG ELECTRONICS CO LTD9 citations74
US7143303B2Nov 28, 2006
Memory device for compensating for a clock skew causing a centering error and a method for compensating for the clock skew
SAMSUNG ELECTRONICS CO LTD8 citations74
US7119594B2Oct 10, 2006
Duty cycle correction circuit of delay locked loop and delay locked loop having the duty cycle correction circuit
SAMSUNG ELECTRONICS CO LTD10 citations74
US10372658B2Aug 6, 2019
Method of reconfiguring DQ pads of memory device and DQ pad reconfigurable memory device
SAMSUNG ELECTRONICS CO LTD2 citations73
US9368178B2Jun 14, 2016
Resistive memory device, memory system including the same and method of reading data from the same
SAMSUNG ELECTRONICS CO LTD6 citations73
US11194579B2Dec 7, 2021
Memory device supporting skip calculation mode and method of operating the same
SAMSUNG ELECTRONICS CO LTD3 citations72
US8022742B2Sep 20, 2011
Circuit for reducing duty distortion in a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD2 citations63
US8000162B2Aug 16, 2011
Voltage-controlled oscillator, phase-locked loop, and memory device
SAMSUNG ELECTRONICS CO LTD3 citations63
US7671651B2Mar 2, 2010
Duty cycle correction circuit of delay locked loop and delay locked loop having the duty cycle correction circuit
SAMSUNG ELECTRONICS CO LTD4 citations63
US7534035B2May 19, 2009
Temperature sensor for generating sectional temperature code and sectional temperature detection method
SAMSUNG ELECTRONICS CO LTD4 citations63
US7167116B2Jan 23, 2007
Memory devices having single bit bus structure with current mode signaling and methods of operating same
SAMSUNG ELECTRONICS CO LTD2 citations63
US6940331B2Sep 6, 2005
Delayed tap signal generating circuit for controlling delay by interpolating two input clocks
SAMSUNG ELECTRONICS CO LTD3 citations63
US11798621B2Oct 24, 2023
Resistive memory device and method for reading data in the resistive memory device
SAMSUNG ELECTRONICS CO LTD0 citations62
US11169711B2Nov 9, 2021
Memory module, memory device, and processing device having a processor mode, and memory system
SAMSUNG ELECTRONICS CO LTD1 citations62
US10665575B2May 26, 2020
Semiconductor package
SAMSUNG ELECTRONICS CO LTD1 citations62
US12014763B2Jun 18, 2024
Magnetic junction memory device and writing method thereof
SAMSUNG ELECTRONICS CO LTD0 citations60
US11443791B2Sep 13, 2022
Magnetic junction memory device and writing method thereof
SAMSUNG ELECTRONICS CO LTD0 citations60
US11889703B2Jan 30, 2024
Magnetic junction memory device and reading method thereof
SAMSUNG ELECTRONICS CO LTD0 citations59
US11515357B2Nov 29, 2022
Magnetic junction memory device and reading method thereof
SAMSUNG ELECTRONICS CO LTD0 citations59
US9659641B2May 23, 2017
On-chip resistance measurement circuit and resistive memory device including the same
SAMSUNG ELECTRONICS CO LTD1 citations52
US9076539B2Jul 7, 2015
Common source semiconductor memory device
SAMSUNG ELECTRONICS CO LTD1 citations52
US7656725B2Feb 2, 2010
Semiconductor memory device which compensates for delay time variations of multi-bit data
SAMSUNG ELECTRONICS CO LTD0 citations52
US7603535B2Oct 13, 2009
Low power consumption semiconductor memory device capable of selectively changing input/output data width and data input/output method
SAMSUNG ELECTRONICS CO LTD0 citations52
US7358774B2Apr 15, 2008
Output driver circuit with pre-emphasis function
SAMSUNG ELECTRONICS CO LTD1 citations52
US11651201B2May 16, 2023
Memory device including arithmetic circuit and neural network system including the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US7944244B2May 17, 2011
Multi-functional logic gate device and programmable integrated circuit device using the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US7830179B2Nov 9, 2010
Multi-functional logic gate device and programmable integrated circuit device using the same
SAMSUNG ELECTRONICS CO LTD0 citations51
KIM CHAN-KYUNG
8 patentsUS8654595B2Feb 18, 2014
Nonvolatile memory device with a clamping voltage generation circuit for compensating the variations in memory cell parameters
KIM CHAN-KYUNG24 citations92
US9171589B2Oct 27, 2015
Memory device, method of performing read or write operation and memory system including the same
KIM CHAN-KYUNG10 citations84
US9042152B2May 26, 2015
Data read circuit, a non-volatile memory device having the same, and a method of reading data from the non-volatile memory device
KIM CHAN-KYUNG10 citations84
US9330743B2May 3, 2016
Memory cores of resistive type memory devices, resistive type memory devices and method of sensing data in the same
KIM CHAN-KYUNG2 citations62
USRE45247ENov 18, 2014
Duty cycle correction circuit of delay locked loop and delay locked loop having the duty cycle correction circuit
KIM CHAN-KYUNG0 citations52
US8680930B2Mar 25, 2014
Oscillator, oscillator implementations and method of generating an osciallating signal
KIM CHAN-KYUNG0 citations52
US8223822B2Jul 17, 2012
Signal transceiver for differential data communication of ternary data and method therefor
KIM CHAN-KYUNG0 citations52
US8106716B2Jan 31, 2012
Oscillator, oscillator implementations and method of generating an oscillating signal
KIM CHAN-KYUNG0 citations52
YOUN YONGSIK
3 patentsUS8750018B2Jun 10, 2014
Sense amplifier circuitry for resistive type memory
YOUN YONGSIK23 citations89
US9070424B2Jun 30, 2015
Sense amplifier circuitry for resistive type memory
YOUN YONGSIK23 citations88
US8885386B2Nov 11, 2014
Write driver in sense amplifier for resistive type memory
YOUN YONGSIK2 citations58
LEE YUN-SANG
1 patentSOHN DONG HYUN
1 patentKIM CHAN KYUNG
1 patentShowing the top 50 of 51 patents by PatentIndex Score.