Inventor · disambiguated record
Darlene Hamilton
Also filed as: HAMILTON DARLENE · HAMILTON DARLENE G · HAMILTON DARLENE GAY
69 granted patents·3 pending applications·2,377 citations·filing 1995–2012
99Inventor score
Top patents by PatentIndex Score
72 records- 0197US7440333B2Method of determining voltage compensation for flash memory devicesSPANSION LLC·Filed 2006·Granted Oct 21, 2008·238 cites·16 claims
- 0296US7130210B2Multi-level ONO flash program algorithm for threshold width controlSPANSION LLC·Filed 2005·Granted Oct 31, 2006·112 cites·53 claims
- 0395US7038950B1Multi bit program algorithmSPANSION LLC·Filed 2004·Granted May 2, 2006·144 cites·21 claims
- 0495US6631086B1On-chip repair of defective address of core flash memory cellsADVANCED MICRO DEVICES INC·Filed 2002·Granted Oct 7, 2003·111 cites·20 claims
- 0595US6590811B1Higher program VT and faster programming rates based on improved erase methodsADVANCED MICRO DEVICES INC·Filed 2002·Granted Jul 8, 2003·92 cites·25 claims
- 0695US6567303B1Charge injectionADVANCED MICRO DEVICES INC·Filed 2002·Granted May 20, 2003·104 cites·25 claims
- 0795US6512701B1Erase method for dual bit virtual ground flashADVANCED MICRO DEVICES INC·Filed 2001·Granted Jan 28, 2003·100 cites·41 claims
- 0895US6442074B1Tailored erase method using higher program VT and higher negative gate eraseADVANCED MICRO DEVICES INC·Filed 2001·Granted Aug 27, 2002·103 cites·56 claims
- 0994US7113431B1Quad bit using hot-hole erase for CBD controlSPANSION LLC·Filed 2005·Granted Sep 26, 2006·45 cites·21 claims
- 1094US7010736B1Address sequencer within BIST (Built-in-Self-Test) systemADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 7, 2006·106 cites·28 claims
- 1194US6307784B1Negative gate eraseADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 23, 2001·82 cites·29 claims
- 1293US8000127B2Method for resetting a resistive change memory elementNANTERO INC·Filed 2009·Granted Aug 16, 2011·64 cites·21 claims
- 1393US6493266B1Soft program and soft program verify of the core cells in flash memory arrayADVANCED MICRO DEVICES INC·Filed 2001·Granted Dec 10, 2002·81 cites·27 claims
- 1493US6456533B1Higher program VT and faster programming rates based on improved erase methodsADVANCED MICRO DEVICES INC·Filed 2001·Granted Sep 24, 2002·62 cites·10 claims
- 1592US8619450B2Method for adjusting a resistive change element using a referenceHAMILTON DARLENE·Filed 2010·Granted Dec 31, 2013·21 cites·35 claims
- 1692US6735114B1Method of improving dynamic reference tracking for flash memory unitADVANCED MICRO DEVICES INC·Filed 2003·Granted May 11, 2004·72 cites·18 claims
- 1791US6331951B1Method and system for embedded chip erase verificationADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 18, 2001·67 cites·23 claims
- 1887US7206224B1Methods and systems for high write performance in multi-bit flash memory devicesSPANSION LLC·Filed 2005·Granted Apr 17, 2007·18 cites·11 claims
- 1987US6791880B1Non-volatile memory read circuit with end of life simulationFASL LLC·Filed 2003·Granted Sep 14, 2004·44 cites·19 claims
- 2087US6344994B1Data retention characteristics as a result of high temperature bakeADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 5, 2002·52 cites·26 claims
- 2186US6707078B1Dummy wordline for erase and bitline leakageFASL LLC·Filed 2002·Granted Mar 16, 2004·39 cites·20 claims
- 2285US6967873B2Memory device and method using positive gate stress to recover overerased cellADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 22, 2005·41 cites·20 claims
- 2385US6799256B2System and method for multi-bit flash reads using dual dynamic referencesADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 28, 2004·41 cites·36 claims
- 2484US8938655B2Extending flash memory data retension via rewrite refreshHAMILTON DARLENE G·Filed 2007·Granted Jan 20, 2015·29 cites·20 claims
- 2583US8391070B2Moving program verify level for programming of memoryBATHUL FATIMA·Filed 2008·Granted Mar 5, 2013·23 cites·17 claims
- 2683US7679967B2Controlling AC disturbance while programmingSPANSION LLC·Filed 2007·Granted Mar 16, 2010·10 cites·23 claims
- 2782US7283402B2Methods and systems for high write performance in multi-bit flash memory devicesSPANSION LLC·Filed 2007·Granted Oct 16, 2007·13 cites·8 claims
- 2881US6778442B1Method of dual cell memory device operation for improved end-of-life read marginADVANCED MICRO DEVICES INC·Filed 2003·Granted Aug 17, 2004·31 cites·28 claims
- 2980US6775187B1Method of programming a dual cell memory deviceADVANCED MICRO DEVICES INC·Filed 2003·Granted Aug 10, 2004·29 cites·19 claims
- 3079US7656705B2Fast single phase program algorithm for quadbitSPANSION LLC·Filed 2007·Granted Feb 2, 2010·13 cites·25 claims
- 3179US6822909B1Method of controlling program threshold voltage distribution of a dual cell memory deviceADVANCED MICRO DEVICES INC·Filed 2003·Granted Nov 23, 2004·27 cites·36 claims
- 3278US7009887B1Method of determining voltage compensation for flash memory devicesFASL LLC·Filed 2004·Granted Mar 7, 2006·23 cites·12 claims
- 3378US6493261B1Single bit array edgesADVANCED MICRO DEVICES INC·Filed 2001·Granted Dec 10, 2002·25 cites·14 claims
- 3477US7284167B2Automated tests for built-in self testSPANSION LLC·Filed 2005·Granted Oct 16, 2007·11 cites·47 claims
- 3575US6768673B1Method of programming and reading a dual cell memory deviceADVANCED MICRO DEVICES INC·Filed 2003·Granted Jul 27, 2004·23 cites·26 claims
- 3674US7251158B2Erase algorithm for multi-level bit flash memorySPANSION LLC·Filed 2004·Granted Jul 31, 2007·22 cites·42 claims
- 3774US6897110B1Method of protecting a memory array from charge damage during fabricationADVANCED MICRO DEVICES INC·Filed 2002·Granted May 24, 2005·22 cites·19 claims
- 3873US7038948B2Read approach for multi-level virtual ground memorySPANSION LLC·Filed 2004·Granted May 2, 2006·20 cites·23 claims
- 3971US7023740B1Substrate bias for programming non-volatile memoryADVANCED MICRO DEVICES INC·Filed 2004·Granted Apr 4, 2006·18 cites·13 claims
- 4070US8941094B2Methods for adjusting the conductivity range of a nanotube fabric layerCLEAVELIN C RINN·Filed 2010·Granted Jan 27, 2015·4 cites·54 claims
- 4169US7672803B1Input of test conditions and output generation for built-in self testSPANSION LLC·Filed 2004·Granted Mar 2, 2010·14 cites·34 claims
- 4269US6944057B1Method to obtain temperature independent program threshold voltage distribution using temperature dependent voltage referenceFASL LLC·Filed 2003·Granted Sep 13, 2005·16 cites·16 claims
- 4368US7068204B1System that facilitates reading multi-level data in non-volatile memorySPANSION LLC·Filed 2004·Granted Jun 27, 2006·15 cites·15 claims
- 4465US6788583B2Pre-charge method for reading a non-volatile memory cellADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 7, 2004·14 cites·19 claims
- 4564US6385093B1I/O partitioning system and methodology to reduce band-to-band tunneling current during eraseADVANCED MICRO DEVICES INC·Filed 2001·Granted May 7, 2002·13 cites·33 claims
- 4663US8264898B2Controlling AC disturbance while programmingCHUNG SUNG-YONG·Filed 2011·Granted Sep 11, 2012·2 cites·20 claims
- 4762US7821840B2Multi-phase programming of multi-level memorySPANSION LLC·Filed 2008·Granted Oct 26, 2010·5 cites·29 claims
- 4859US7415646B1Page—EXE erase algorithm for flash memorySPANSION LLC·Filed 2004·Granted Aug 19, 2008·10 cites·40 claims
- 4958US6901010B1Erase method for a dual bit memory cellADVANCED MICRO DEVICES INC·Filed 2002·Granted May 31, 2005·12 cites·5 claims
- 5057US7986562B2Controlling AC disturbance while programmingSPANSION LLC·Filed 2009·Granted Jul 26, 2011·2 cites·12 claims
Showing the top 50 of 72 patent records by PatentIndex Score.
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