Inventor · disambiguated record
Satoko Nakagawa
Also filed as: NAKAGAWA SATOKO
2 granted patents·1 pending application·9 citations·filing 2014–2017
53Inventor score
Technology areasH10P
Files withGLOBALWAFERS JAPAN CO LTD3
Top patents by PatentIndex Score
3 records- 0184US9541452B2Calibration curve formation method, impurity concentration measurement method, and semiconductor wafer manufacturing methodGLOBALWAFERS JAPAN CO LTD·Filed 2015·Granted Jan 10, 2017·7 cites·13 claims
- 0262US10330599B2Calibration curve determination method, carbon concentration measurement method, and silicon wafer-manufacturing methodGLOBALWAFERS JAPAN CO LTD·Filed 2017·Granted Jun 25, 2019·2 cites·10 claims
- 0334US2015017086A1Silicon single crystal and method for manufacture thereofGLOBALWAFERS JAPAN CO LTD·Filed 2014·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →