Inventor

MAENO HIDESHI

JP43 patents

⚠️ This page may combine multiple inventors who share the name “MAENO HIDESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MAENO HIDESHI

MITSUBISHI ELECTRIC CORP

Test circuit

Semiconductor memory testing device

Flip-flop circuit, scan path and storage circuit

Pseudo-random number generating circuit and bidirectional shift register

Electronic system with self-test function and simulation circuit for electronic system

Semiconductor device

Test circuit and a redundancy circuit for an internal memory circuit

Semiconductor memory testing device

Method and device for testing content addressable memory circuit and content addressable memory circuit with redundancy function

Semiconductor memory

Semiconductor memory device with reduced probability of power consumption

Memory circuit, data control circuit of memory circuit and address assigning circuit of memory circuit

Semiconductor memory device having serial addressing and operating method thereof

Semiconductor integrated circuit and method of testing same

Testing method and test apparatus in semiconductor apparatus

Semiconductor integrated circuit device having multi-port RAM memory with random logic portion which can be tested without additional test circuitry

Test auxiliary circuit for testing semiconductor device

Semiconductor integrated circuit with a scan path circuit

Semiconductor integrated circuit device

Semiconductor storage circuit device operating in a plurality of operation modes and corresponding device for designing a semiconductor storage circuit device

Semiconductor integrated circuit device

Memory cell array semiconductor integrated circuit device

Scan register and testing circuit using the same

Semiconductor integrated circuit device with fault analysis function

Test circuit

Scan path forming circuit

Semiconductor memory device and method of reading data therefrom

Semiconductor memory device having scan path for testing

Semiconductor test device

Testing apparatus for semiconductor device

Semiconductor memory and layout/circuit information generating apparatus

Semiconductor device

Semiconductor integrated circuit

Semiconductor integrated circuit device

Memory cell array semiconductor integrated circuit device

Semiconductor integrated circuit device with test circuit

RENESAS TECH CORP

Semiconductor integrated circuit with test circuit

Semiconductor integrated circuit device having a test circuit of a random access memory

Semiconductor integrated circuit with test circuit

RENESAS ELECTRONICS CORP

Semiconductor device and diagnostic method therefor

Semiconductor device, memory test method for semiconductor device, and test pattern generation program

Semiconductor device and diagnosis method thereof

MIUTSUBISHI DENKI KABUSHIKI KA

Memory cell array semiconductor integrated circuit device