Inventor
BEINGLASS ISRAEL
60 patents
⚠️ This page may combine multiple inventors who share the name “BEINGLASS ISRAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
26 patentsUS5645646AJul 8, 1997
Susceptor for deposition apparatus
APPLIED MATERIALS INC406 citations99
US5607724AMar 4, 1997
Low temperature high pressure silicon deposition method
APPLIED MATERIALS INC102 citations99
US5551982ASep 3, 1996
Semiconductor wafer process chamber with susceptor back coating
APPLIED MATERIALS INC136 citations99
US5352636AOct 4, 1994
In situ method for cleaning silicon surface and forming layer thereon in same chamber
APPLIED MATERIALS INC305 citations99
US6197694B1Mar 6, 2001
In situ method for cleaning silicon surface and forming layer thereon in same chamber
APPLIED MATERIALS INC86 citations98
US5932286AAug 3, 1999
Deposition of silicon nitride thin films
APPLIED MATERIALS INC136 citations98
US6169030B1Jan 2, 2001
Metallization process and method
APPLIED MATERIALS INC57 citations96
US5876797AMar 2, 1999
Low temperature high pressure silicon deposition method
APPLIED MATERIALS INC81 citations96
US5700520ADec 23, 1997
Low temperature, high pressure silicon deposition method
APPLIED MATERIALS INC78 citations96
US5695819ADec 9, 1997
Method of enhancing step coverage of polysilicon deposits
APPLIED MATERIALS INC79 citations96
US5599397AFeb 4, 1997
Semiconductor wafer process chamber with suspector back coating
APPLIED MATERIALS INC43 citations96
US5874129AFeb 23, 1999
Low temperature, high pressure silicon deposition method
APPLIED MATERIALS INC87 citations94
US5614257AMar 25, 1997
Low temperature, high pressure silicon deposition method
APPLIED MATERIALS INC94 citations94
US5141892AAug 25, 1992
Process for depositing highly doped polysilicon layer on stepped surface of semiconductor wafer resulting in enhanced step coverage
APPLIED MATERIALS INC33 citations93
US7427568B2Sep 23, 2008
Method of forming an interconnect structure
APPLIED MATERIALS INC20 citations92
US7115516B2Oct 3, 2006
Method of depositing a material layer
APPLIED MATERIALS INC18 citations92
US6402850B1Jun 11, 2002
Depositing polysilicon films having improved uniformity and apparatus therefor
APPLIED MATERIALS INC28 citations92
US5940733AAug 17, 1999
Method of making polysilicon/tungsten silicide multilayer composite on an integrated circuit structure
APPLIED MATERIALS INC38 citations92
US5834059ANov 10, 1998
Process of depositing a layer of material on a wafer with susceptor back coating
APPLIED MATERIALS INC29 citations92
US5576059ANov 19, 1996
Depositing polysilicon films having improved uniformity and apparatus therefor
APPLIED MATERIALS INC39 citations92
US6954711B2Oct 11, 2005
Test substrate reclamation method and apparatus
APPLIED MATERIALS INC20 citations91
US4975385ADec 4, 1990
Method of constructing lightly doped drain (LDD) integrated circuit structure
APPLIED MATERIALS INC48 citations91
US7401066B2Jul 15, 2008
Correlation of end-of-line data mining with process tool data mining
APPLIED MATERIALS INC25 citations88
US6017144AJan 25, 2000
Method and apparatus for depositing highly oriented and reflective crystalline layers using a low temperature seeding layer
APPLIED MATERIALS INC50 citations88
US7772121B2Aug 10, 2010
Method of forming a trench structure
APPLIED MATERIALS INC12 citations84
US5725673AMar 10, 1998
Semiconductor wafer process chamber with susceptor back coating
APPLIED MATERIALS INC14 citations82
OR-BACH ZVI
15 patentsUS8541819B1Sep 24, 2013
Semiconductor device and structure
OR-BACH ZVI152 citations99
US8058137B1Nov 15, 2011
Method for fabrication of a semiconductor device and structure
OR-BACH ZVI129 citations99
US9136153B2Sep 15, 2015
3D semiconductor device and structure with back-bias
OR-BACH ZVI53 citations98
US8754533B2Jun 17, 2014
Monolithic three-dimensional semiconductor device and structure
OR-BACH ZVI68 citations98
US8395191B2Mar 12, 2013
Semiconductor device and structure
OR-BACH ZVI51 citations98
US8273610B2Sep 25, 2012
Method of constructing a semiconductor device and structure
OR-BACH ZVI111 citations98
US8237228B2Aug 7, 2012
System comprising a semiconductor device and structure
OR-BACH ZVI72 citations98
US9711407B2Jul 18, 2017
Method of manufacturing a three dimensional integrated circuit by transfer of a mono-crystalline layer
OR-BACH ZVI29 citations93
US8709880B2Apr 29, 2014
Method for fabrication of a semiconductor device and structure
OR-BACH ZVI14 citations93
US8294159B2Oct 23, 2012
Method for fabrication of a semiconductor device and structure
OR-BACH ZVI35 citations93
US8153499B2Apr 10, 2012
Method for fabrication of a semiconductor device and structure
OR-BACH ZVI37 citations93
US8148728B2Apr 3, 2012
Method for fabrication of a semiconductor device and structure
OR-BACH ZVI22 citations93
US8907442B2Dec 9, 2014
System comprising a semiconductor device and structure
OR-BACH ZVI11 citations84
US8664042B2Mar 4, 2014
Method for fabrication of configurable systems
OR-BACH ZVI8 citations84
US8405420B2Mar 26, 2013
System comprising a semiconductor device and structure
OR-BACH ZVI10 citations83
MONOLITHIC 3D INC
8 patentsUS8362482B2Jan 29, 2013
Semiconductor device and structure
MONOLITHIC 3D INC39 citations94
US9613844B2Apr 4, 2017
3D semiconductor device having two layers of transistors
MONOLITHIC 3D INC19 citations93
US8378494B2Feb 19, 2013
Method for fabrication of a semiconductor device and structure
MONOLITHIC 3D INC16 citations93
US7986042B2Jul 26, 2011
Method for fabrication of a semiconductor device and structure
MONOLITHIC 3D INC25 citations93
US7964916B2Jun 21, 2011
Method for fabrication of a semiconductor device and structure
MONOLITHIC 3D INC42 citations93
US7960242B2Jun 14, 2011
Method for fabrication of a semiconductor device and structure
MONOLITHIC 3D INC24 citations93
US9564432B2Feb 7, 2017
3D semiconductor device and structure
MONOLITHIC 3D INC11 citations84
US9406670B1Aug 2, 2016
System comprising a semiconductor device and structure
MONOLITHIC 3D INC11 citations84
INTEL CORP
1 patentShowing the top 50 of 60 patents by PatentIndex Score.