P

Inventor

LIANG MONG-SONG

TW209 patents
⚠️ This page may combine multiple inventors who share the name “LIANG MONG-SONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

49 patents
US6071783AJun 6, 2000

Pseudo silicon on insulator MOSFET device

TAIWAN SEMICONDUCTOR MFG175 citations99
US5851881ADec 22, 1998

Method of making monos flash memory for multi-level logic

TAIWAN SEMICONDUCTOR MFG140 citations99
US5714412AFeb 3, 1998

Multi-level, split-gate, flash memory cell and method of manufacture thereof

TAIWAN SEMICONDUCTOR MFG137 citations99
US7868317B2Jan 11, 2011

MOS devices with partial stressor channel

TAIWAN SEMICONDUCTOR MFG51 citations98
US7402866B2Jul 22, 2008

Backside contacts for MOS devices

TAIWAN SEMICONDUCTOR MFG63 citations98
US6436771B1Aug 20, 2002

Method of forming a semiconductor device with multiple thickness gate dielectric layers

TAIWAN SEMICONDUCTOR MFG90 citations98
US6346729B1Feb 12, 2002

Pseudo silicon on insulator MOSFET device

TAIWAN SEMICONDUCTOR MFG110 citations98
US6281545B1Aug 28, 2001

Multi-level, split-gate, flash memory cell

TAIWAN SEMICONDUCTOR MFG98 citations98
US6093606AJul 25, 2000

Method of manufacture of vertical stacked gate flash memory device

TAIWAN SEMICONDUCTOR MFG106 citations98
US5877523AMar 2, 1999

Multi-level split- gate flash memory cell

TAIWAN SEMICONDUCTOR MFG114 citations98
US5679591AOct 21, 1997

Method of making raised-bitline contactless trenched flash memory cell

TAIWAN SEMICONDUCTOR MFG120 citations98
US7554110B2Jun 30, 2009

MOS devices with partial stressor channel

TAIWAN SEMICONDUCTOR MFG48 citations96
US6806192B2Oct 19, 2004

Method of barrier-less integration with copper alloy

TAIWAN SEMICONDUCTOR MFG45 citations96
US6706629B1Mar 16, 2004

Barrier-free copper interconnect

TAIWAN SEMICONDUCTOR MFG54 citations96
US6548856B1Apr 15, 2003

Vertical stacked gate flash memory device

TAIWAN SEMICONDUCTOR MFG61 citations96
US6440833B1Aug 27, 2002

Method of protecting a copper pad structure during a fuse opening procedure

TAIWAN SEMICONDUCTOR MFG62 citations96
US6387775B1May 14, 2002

Fabrication of MIM capacitor in copper damascene process

TAIWAN SEMICONDUCTOR MFG69 citations96
US6054344AApr 25, 2000

OTP (open trigger path) latchup scheme using buried-diode for sub-quarter micron transistors

TAIWAN SEMICONDUCTOR MFG80 citations96
US5858830AJan 12, 1999

Method of making dual isolation regions for logic and embedded memory devices

TAIWAN SEMICONDUCTOR MFG60 citations96
US5818085AOct 6, 1998

Body contact for a MOSFET device fabricated in an SOI layer

TAIWAN SEMICONDUCTOR MFG53 citations96
US5804858ASep 8, 1998

Body contacted SOI MOSFET

TAIWAN SEMICONDUCTOR MFG65 citations96
US5801415ASep 1, 1998

Non-volatile-memory cell for electrically programmable read only memory having a trench-like coupling capacitors

TAIWAN SEMICONDUCTOR MFG69 citations96
US5792684AAug 11, 1998

Process for fabricating MOS memory devices, with a self-aligned contact structure, and MOS logic devices with salicide, both on a single semiconductor chip

TAIWAN SEMICONDUCTOR MFG63 citations96
US5702988ADec 30, 1997

Blending integrated circuit technology

TAIWAN SEMICONDUCTOR MFG77 citations96
US5677557AOct 14, 1997

Method for forming buried plug contacts on semiconductor integrated circuits

TAIWAN SEMICONDUCTOR MFG61 citations96
US5607874AMar 4, 1997

Method for fabricating a DRAM cell with a T shaped storage capacitor

TAIWAN SEMICONDUCTOR MFG86 citations96
US5591650AJan 7, 1997

Method of making a body contacted SOI MOSFET

TAIWAN SEMICONDUCTOR MFG55 citations96
US5573961ANov 12, 1996

Method of making a body contact for a MOSFET device fabricated in an SOI layer

TAIWAN SEMICONDUCTOR MFG66 citations96
US5504031AApr 2, 1996

Elevated source/drain with solid phase diffused source/drain extension for deep sub-micron mosfets

TAIWAN SEMICONDUCTOR MFG60 citations96
US5372957ADec 13, 1994

Multiple tilted angle ion implantation MOSFET method

TAIWAN SEMICONDUCTOR MFG92 citations96
US6174754B1Jan 16, 2001

Methods for formation of silicon-on-insulator (SOI) and source/drain-on-insulator(SDOI) transistors

TAIWAN SEMICONDUCTOR MFG77 citations95
US5668035ASep 16, 1997

Method for fabricating a dual-gate dielectric module for memory with embedded logic technology

TAIWAN SEMICONDUCTOR MFG127 citations95
US5480814AJan 2, 1996

Process of making a polysilicon barrier layer in a self-aligned contact module

TAIWAN SEMICONDUCTOR MFG70 citations95
US8035165B2Oct 11, 2011

Integrating a first contact structure in a gate last process

TAIWAN SEMICONDUCTOR MFG25 citations93
US7528028B2May 5, 2009

Super anneal for process induced strain modulation

TAIWAN SEMICONDUCTOR MFG22 citations93
US7238989B2Jul 3, 2007

Strain balanced structure with a tensile strained silicon channel and a compressive strained silicon-germanium channel for CMOS performance enhancement

TAIWAN SEMICONDUCTOR MFG31 citations93
US6967155B2Nov 22, 2005

Adhesion of copper and etch stop layer for copper alloy

TAIWAN SEMICONDUCTOR MFG16 citations93
US6955952B2Oct 18, 2005

Strain balanced structure with a tensile strained silicon channel and a compressive strained silicon-germanium channel for CMOS performance enhancement

TAIWAN SEMICONDUCTOR MFG29 citations93
US6716753B1Apr 6, 2004

Method for forming a self-passivated copper interconnect structure

TAIWAN SEMICONDUCTOR MFG36 citations93
US6600186B1Jul 29, 2003

Process technology architecture of embedded DRAM

TAIWAN SEMICONDUCTOR MFG26 citations93
US6590344B2Jul 8, 2003

Selectively controllable gas feed zones for a plasma reactor

TAIWAN SEMICONDUCTOR MFG55 citations93
US6455330B1Sep 24, 2002

Methods to create high-k dielectric gate electrodes with backside cleaning

TAIWAN SEMICONDUCTOR MFG51 citations93
US6355962B1Mar 12, 2002

CMOS FET with P-well with P- type halo under drain and counterdoped N- halo under source region

TAIWAN SEMICONDUCTOR MFG30 citations93
US6339029B1Jan 15, 2002

Method to form copper interconnects

TAIWAN SEMICONDUCTOR MFG34 citations93
US6258641B1Jul 10, 2001

OTP (open trigger path) latchup scheme using triple and buried well for sub-quarter micron transistors

TAIWAN SEMICONDUCTOR MFG33 citations93
US6201273B1Mar 13, 2001

Structure for a double wall tub shaped capacitor

TAIWAN SEMICONDUCTOR MFG19 citations93
US6184155B1Feb 6, 2001

Method for forming a ultra-thin gate insulator layer

TAIWAN SEMICONDUCTOR MFG39 citations93
US6136638AOct 24, 2000

Process technology architecture of embedded DRAM

TAIWAN SEMICONDUCTOR MFG26 citations93
US6124618ASep 26, 2000

Dynamic threshold MOSFET using accumulated base BJT level shifter for low voltage sub-quarter micron transistor

TAIWAN SEMICONDUCTOR MFG16 citations93

ADVANCED MICRO DEVICES INC

1 patent

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