Inventor
LIANG MONG-SONG
TW209 patents
⚠️ This page may combine multiple inventors who share the name “LIANG MONG-SONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
49 patentsUS6071783AJun 6, 2000
Pseudo silicon on insulator MOSFET device
TAIWAN SEMICONDUCTOR MFG175 citations99
US5851881ADec 22, 1998
Method of making monos flash memory for multi-level logic
TAIWAN SEMICONDUCTOR MFG140 citations99
US5714412AFeb 3, 1998
Multi-level, split-gate, flash memory cell and method of manufacture thereof
TAIWAN SEMICONDUCTOR MFG137 citations99
US7868317B2Jan 11, 2011
MOS devices with partial stressor channel
TAIWAN SEMICONDUCTOR MFG51 citations98
US7402866B2Jul 22, 2008
Backside contacts for MOS devices
TAIWAN SEMICONDUCTOR MFG63 citations98
US6436771B1Aug 20, 2002
Method of forming a semiconductor device with multiple thickness gate dielectric layers
TAIWAN SEMICONDUCTOR MFG90 citations98
US6346729B1Feb 12, 2002
Pseudo silicon on insulator MOSFET device
TAIWAN SEMICONDUCTOR MFG110 citations98
US6281545B1Aug 28, 2001
Multi-level, split-gate, flash memory cell
TAIWAN SEMICONDUCTOR MFG98 citations98
US6093606AJul 25, 2000
Method of manufacture of vertical stacked gate flash memory device
TAIWAN SEMICONDUCTOR MFG106 citations98
US5877523AMar 2, 1999
Multi-level split- gate flash memory cell
TAIWAN SEMICONDUCTOR MFG114 citations98
US5679591AOct 21, 1997
Method of making raised-bitline contactless trenched flash memory cell
TAIWAN SEMICONDUCTOR MFG120 citations98
US7554110B2Jun 30, 2009
MOS devices with partial stressor channel
TAIWAN SEMICONDUCTOR MFG48 citations96
US6806192B2Oct 19, 2004
Method of barrier-less integration with copper alloy
TAIWAN SEMICONDUCTOR MFG45 citations96
US6706629B1Mar 16, 2004
Barrier-free copper interconnect
TAIWAN SEMICONDUCTOR MFG54 citations96
US6548856B1Apr 15, 2003
Vertical stacked gate flash memory device
TAIWAN SEMICONDUCTOR MFG61 citations96
US6440833B1Aug 27, 2002
Method of protecting a copper pad structure during a fuse opening procedure
TAIWAN SEMICONDUCTOR MFG62 citations96
US6387775B1May 14, 2002
Fabrication of MIM capacitor in copper damascene process
TAIWAN SEMICONDUCTOR MFG69 citations96
US6054344AApr 25, 2000
OTP (open trigger path) latchup scheme using buried-diode for sub-quarter micron transistors
TAIWAN SEMICONDUCTOR MFG80 citations96
US5858830AJan 12, 1999
Method of making dual isolation regions for logic and embedded memory devices
TAIWAN SEMICONDUCTOR MFG60 citations96
US5818085AOct 6, 1998
Body contact for a MOSFET device fabricated in an SOI layer
TAIWAN SEMICONDUCTOR MFG53 citations96
US5804858ASep 8, 1998
Body contacted SOI MOSFET
TAIWAN SEMICONDUCTOR MFG65 citations96
US5801415ASep 1, 1998
Non-volatile-memory cell for electrically programmable read only memory having a trench-like coupling capacitors
TAIWAN SEMICONDUCTOR MFG69 citations96
US5792684AAug 11, 1998
Process for fabricating MOS memory devices, with a self-aligned contact structure, and MOS logic devices with salicide, both on a single semiconductor chip
TAIWAN SEMICONDUCTOR MFG63 citations96
US5702988ADec 30, 1997
Blending integrated circuit technology
TAIWAN SEMICONDUCTOR MFG77 citations96
US5677557AOct 14, 1997
Method for forming buried plug contacts on semiconductor integrated circuits
TAIWAN SEMICONDUCTOR MFG61 citations96
US5607874AMar 4, 1997
Method for fabricating a DRAM cell with a T shaped storage capacitor
TAIWAN SEMICONDUCTOR MFG86 citations96
US5591650AJan 7, 1997
Method of making a body contacted SOI MOSFET
TAIWAN SEMICONDUCTOR MFG55 citations96
US5573961ANov 12, 1996
Method of making a body contact for a MOSFET device fabricated in an SOI layer
TAIWAN SEMICONDUCTOR MFG66 citations96
US5504031AApr 2, 1996
Elevated source/drain with solid phase diffused source/drain extension for deep sub-micron mosfets
TAIWAN SEMICONDUCTOR MFG60 citations96
US5372957ADec 13, 1994
Multiple tilted angle ion implantation MOSFET method
TAIWAN SEMICONDUCTOR MFG92 citations96
US6174754B1Jan 16, 2001
Methods for formation of silicon-on-insulator (SOI) and source/drain-on-insulator(SDOI) transistors
TAIWAN SEMICONDUCTOR MFG77 citations95
US5668035ASep 16, 1997
Method for fabricating a dual-gate dielectric module for memory with embedded logic technology
TAIWAN SEMICONDUCTOR MFG127 citations95
US5480814AJan 2, 1996
Process of making a polysilicon barrier layer in a self-aligned contact module
TAIWAN SEMICONDUCTOR MFG70 citations95
US8035165B2Oct 11, 2011
Integrating a first contact structure in a gate last process
TAIWAN SEMICONDUCTOR MFG25 citations93
US7528028B2May 5, 2009
Super anneal for process induced strain modulation
TAIWAN SEMICONDUCTOR MFG22 citations93
US7238989B2Jul 3, 2007
Strain balanced structure with a tensile strained silicon channel and a compressive strained silicon-germanium channel for CMOS performance enhancement
TAIWAN SEMICONDUCTOR MFG31 citations93
US6967155B2Nov 22, 2005
Adhesion of copper and etch stop layer for copper alloy
TAIWAN SEMICONDUCTOR MFG16 citations93
US6955952B2Oct 18, 2005
Strain balanced structure with a tensile strained silicon channel and a compressive strained silicon-germanium channel for CMOS performance enhancement
TAIWAN SEMICONDUCTOR MFG29 citations93
US6716753B1Apr 6, 2004
Method for forming a self-passivated copper interconnect structure
TAIWAN SEMICONDUCTOR MFG36 citations93
US6600186B1Jul 29, 2003
Process technology architecture of embedded DRAM
TAIWAN SEMICONDUCTOR MFG26 citations93
US6590344B2Jul 8, 2003
Selectively controllable gas feed zones for a plasma reactor
TAIWAN SEMICONDUCTOR MFG55 citations93
US6455330B1Sep 24, 2002
Methods to create high-k dielectric gate electrodes with backside cleaning
TAIWAN SEMICONDUCTOR MFG51 citations93
US6355962B1Mar 12, 2002
CMOS FET with P-well with P- type halo under drain and counterdoped N- halo under source region
TAIWAN SEMICONDUCTOR MFG30 citations93
US6339029B1Jan 15, 2002
Method to form copper interconnects
TAIWAN SEMICONDUCTOR MFG34 citations93
US6258641B1Jul 10, 2001
OTP (open trigger path) latchup scheme using triple and buried well for sub-quarter micron transistors
TAIWAN SEMICONDUCTOR MFG33 citations93
US6201273B1Mar 13, 2001
Structure for a double wall tub shaped capacitor
TAIWAN SEMICONDUCTOR MFG19 citations93
US6184155B1Feb 6, 2001
Method for forming a ultra-thin gate insulator layer
TAIWAN SEMICONDUCTOR MFG39 citations93
US6136638AOct 24, 2000
Process technology architecture of embedded DRAM
TAIWAN SEMICONDUCTOR MFG26 citations93
US6124618ASep 26, 2000
Dynamic threshold MOSFET using accumulated base BJT level shifter for low voltage sub-quarter micron transistor
TAIWAN SEMICONDUCTOR MFG16 citations93
ADVANCED MICRO DEVICES INC
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