Inventor
CLARK ROBERT
US67 patents
⚠️ This page may combine multiple inventors who share the name “CLARK ROBERT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
23 patentsUS11101173B2Aug 24, 2021
Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same
TOKYO ELECTRON LTD11 citations94
US10916472B2Feb 9, 2021
Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same
TOKYO ELECTRON LTD14 citations94
US11456212B2Sep 27, 2022
Platform and method of operating for integrated end-to-end fully self-aligned interconnect process
TOKYO ELECTRON LTD4 citations84
US10784175B2Sep 22, 2020
Platform and method of operating for integrated end-to-end gate contact process
TOKYO ELECTRON LTD6 citations84
US10727057B2Jul 28, 2020
Platform and method of operating for integrated end-to-end self-aligned multi-patterning process
TOKYO ELECTRON LTD10 citations83
US10861744B2Dec 8, 2020
Platform and method of operating for integrated end-to-end CMP-less interconnect process
TOKYO ELECTRON LTD7 citations82
US11424236B2Aug 23, 2022
Facilitating alignment of stacked chiplets
TOKYO ELECTRON LTD2 citations73
US10964608B2Mar 30, 2021
Platform and method of operating for integrated end-to-end gate contact process
TOKYO ELECTRON LTD2 citations73
US10886173B2Jan 5, 2021
Platform and method of operating for integrated end-to-end fully self-aligned interconnect process
TOKYO ELECTRON LTD2 citations73
US11024535B2Jun 1, 2021
Method for filling recessed features in semiconductor devices with a low-resistivity metal
TOKYO ELECTRON LTD4 citations71
US12372871B2Jul 29, 2025
EUV active films for EUV lithography
TOKYO ELECTRON LTD0 citations63
US12191297B2Jan 7, 2025
Facilitating alignment of stacked chiplets
TOKYO ELECTRON LTD0 citations63
US11769677B2Sep 26, 2023
Substrate processing tool with integrated metrology and method of using
TOKYO ELECTRON LTD0 citations63
US11462414B2Oct 4, 2022
Atomic layer etching of metal oxides
TOKYO ELECTRON LTD0 citations63
US11264254B2Mar 1, 2022
Substrate processing tool with integrated metrology and method of using
TOKYO ELECTRON LTD0 citations63
US11764113B2Sep 19, 2023
Method of 3D logic fabrication to sequentially decrease processing temperature and maintain material thermal thresholds
TOKYO ELECTRON LTD1 citations62
US11594451B2Feb 28, 2023
Platform and method of operating for integrated end-to-end fully self-aligned interconnect process
TOKYO ELECTRON LTD0 citations62
US11398379B2Jul 26, 2022
Platform and method of operating for integrated end-to-end self-aligned multi-patterning process
TOKYO ELECTRON LTD0 citations62
US10923394B2Feb 16, 2021
Platform and method of operating for integrated end-to-end fully self-aligned interconnect process
TOKYO ELECTRON LTD0 citations62
US11621190B2Apr 4, 2023
Method for filling recessed features in semiconductor devices with a low-resistivity metal
TOKYO ELECTRON LTD0 citations61
US11894240B2Feb 6, 2024
Semiconductor processing systems with in-situ electrical bias
TOKYO ELECTRON LTD0 citations59
US11302588B2Apr 12, 2022
Platform and method of operating for integrated end-to-end area-selective deposition process
TOKYO ELECTRON LTD1 citations58
US11152268B2Oct 19, 2021
Platform and method of operating for integrated end-to-end area-selective deposition process
TOKYO ELECTRON LTD0 citations58
GOOGLE LLC
4 patentsUS10923107B2Feb 16, 2021
Clockwork hierarchical variational encoder
GOOGLE LLC2 citations71
US12272349B2Apr 8, 2025
Attention-based clockwork hierarchical variational encoder
GOOGLE LLC0 citations61
US12080272B2Sep 3, 2024
Attention-based clockwork hierarchical variational encoder
GOOGLE LLC1 citations61
US11393453B2Jul 19, 2022
Clockwork hierarchical variational encoder
GOOGLE LLC0 citations61
CLARK ROBERT
3 patentsORACLE INT CORP
3 patentsUS11843510B2Dec 12, 2023
Automatically inferring software-defined network policies from the observed workload in a computing environment
ORACLE INT CORP1 citations71
US11463314B2Oct 4, 2022
Automatically inferring software-defined network policies from the observed workload in a computing environment
ORACLE INT CORP4 citations71
US12143270B2Nov 12, 2024
Automatically inferring software-defined network policies from the observed workload in a computing environment
ORACLE INT CORP0 citations60
LEGENT CORP
2 patentsGENMARK DIAGNOSTICS INC
2 patentsSMITHKLINE BEECHAM CORP
2 patentsTOASTMASTER INC
1 patentMULTI ARC VACUUM SYST
1 patentROSSLYN PREC LTD
1 patentCONAX FLORIDA CORP
1 patentBUCHANAN KRISTOPHER
1 patent(unassigned)
1 patentSKIVIEZ INC
1 patentPARKEL YVONNE
1 patentREDLINE INNOVATIONS INC
1 patentGEORGIA TECH RES INST
1 patentDAKO DENMARK AS
1 patentShowing the top 50 of 67 patents by PatentIndex Score.