Inventor

KANG SANG-SEOK

KR63 patents

⚠️ This page may combine multiple inventors who share the name “KANG SANG-SEOK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KANG SANG-SEOK

SAMSUNG ELECTRONICS CO LTD

Semiconductor memory device and method of identifying programmed defective address thereof

Integrated circuit memory devices and operating methods that are configured to output data bits at a lower rate in a test mode of operation

Fuse circuit and program status detecting method thereof

Circuit for converting internal voltage of semiconductor device

Voltage clamping circuit for semiconductor devices

Fuse option circuit of integrated circuit and method thereof

Internal power supply circuit for use in a semiconductor device

Integrated circuit memory devices having dummy memory cells therein for inhibiting memory failures

Fuse arrangement and integrated circuit device using the same

Decoding circuit for controlling activation of wordlines in a semiconductor memory device

Semiconductor memory device having dummy sense amplifiers and methods of utilizing the same

Test apparatus for semiconductor memory device

Method and apparatus for controlling a high voltage generator in a wafer burn-in test

Test signal generating circuit of a semiconductor device with pins receiving signals of multiple voltage levels and method for invoking test modes

Dynamic random access memory and communications terminal including the same

Apparatus and methods for generating a column select line signal in semiconductor memory device

Voltage and time control circuits

Input circuit having signature circuits in parallel in semiconductor device

Arrangement of bitline boosting capacitor in semiconductor memory device

Semiconductor memory device having sequentially disabling activated word lines

Integrated circuit memory devices with improved twisted bit-line structures

Integrated circuits including function identification circuits having operating modes that identify corresponding functions of the integrated circuits

Method and apparatus for controlling a high voltage generator in a wafer burn-in test

Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same

Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell

Memory device, memory module including the memory device, method of fabricating the memory module, and method of repairing the memory module

Multi-bank integrated circuit memory devices having cross-coupled isolation and precharge circuits therein

Burn-in stress circuit for semiconductor memory device

Semiconductor memory device including on die termination circuit and on die termination method thereof

Fuse circuit with controlled fuse burn out and method thereof

Circuit for generating control signal using make-link type fuse

Mode selection circuit for semiconductor memory device

Input/output line structure of a semiconductor memory device

Memory module and a memory test system for testing the same

Parallel bit test circuit and method for semiconductor memory device

Bit line sense amplifier and method thereof

Circuit and method of generating internal supply voltage in semiconductor memory device

Semiconductor device with malfunction control circuit and controlling method thereof

Memory device, memory module including the memory device, method of fabricating the memory module, and method of repairing the memory module

Integrated circuit memory devices including transmission parts that are adjacent input/output selection parts

Circuits and methods for burn-in of integrated circuits using potential differences between adjacent main word lines

LIM JONG HYOUNG

Semiconductor device, method of adjusting load capacitance for the same, and semiconductor system including the same

Semiconductor memory device for self refresh and memory system having the same

KANG SANG-SEOK

Semiconductor memory device

Fuse circuit and semiconductor device having the same

KANG SANG SEOK

DRAM device and ODT resistor value adjustment method and computer program for the same

DRAM device and ODT resistor value adjustment method and computer program for the same

JOO JAE HOON

Mobile system on chip (SoC) and mobile terminal using the mobile SoC, and method for refreshing a memory in the mobile SoC

HONG MIN-KI

Semiconductor memory device having dummy sense amplifiers and methods of utilizing the same

CHOI JONG-HYUN

Semiconductor memory devices including burn-in test circuits