Inventor
BAE CHOEL-HWYI
KR8 patents
Patents
8 patentsUS7642106B2Jan 5, 2010
Methods for identifying an allowable process margin for integrated circuits
SAMSUNG ELECTRONICS CO LTD81 citations95
US9064732B2Jun 23, 2015
Semiconductor device including work function control film patterns and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD9 citations82
US7802210B2Sep 21, 2010
Methods and systems for analyzing layouts of semiconductor integrated circuit devices
SAMSUNG ELECTRONICS CO LTD9 citations76
US7840917B2Nov 23, 2010
Method of correcting a design pattern for an integrated circuit and an apparatus for performing the same
SAMSUNG ELECTRONICS CO LTD7 citations73
US8941183B2Jan 27, 2015
Semiconductor device
SAMSUNG ELECTRONICS CO LTD3 citations61
US7733099B2Jun 8, 2010
Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect
SAMSUNG ELECTRONICS CO LTD6 citations58
US7705621B2Apr 27, 2010
Test pattern and method of monitoring defects using the same
SAMSUNG ELECTRONICS CO LTD3 citations56
US7703055B2Apr 20, 2010
Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of hole
SAMSUNG ELECTRONICS CO LTD0 citations34