Inventor
MORGAN PAUL A
US40 patents
⚠️ This page may combine multiple inventors who share the name “MORGAN PAUL A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
29 patentsUS6290863B1Sep 18, 2001
Method and apparatus for etch of a specific subarea of a semiconductor work object
MICRON TECHNOLOGY INC79 citations96
US6787450B2Sep 7, 2004
High aspect ratio fill method and resulting structure
MICRON TECHNOLOGY INC26 citations93
US6756682B2Jun 29, 2004
High aspect ratio fill method and resulting structure
MICRON TECHNOLOGY INC28 citations93
US6758938B1Jul 6, 2004
Delivery of dissolved ozone
MICRON TECHNOLOGY INC30 citations92
US6737283B2May 18, 2004
Method to isolate device layer edges through mechanical spacing
MICRON TECHNOLOGY INC19 citations92
US6645874B1Nov 11, 2003
Delivery of dissolved ozone
MICRON TECHNOLOGY INC34 citations92
US6589882B2Jul 8, 2003
Copper post-etch cleaning process
MICRON TECHNOLOGY INC26 citations92
US6017827AJan 25, 2000
System and method for mixing a gas into a solvent used in semiconductor processing
MICRON TECHNOLOGY INC41 citations91
US10607844B2Mar 31, 2020
Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same
MICRON TECHNOLOGY INC4 citations84
US10096483B2Oct 9, 2018
Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same
MICRON TECHNOLOGY INC6 citations84
US9761457B2Sep 12, 2017
Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same
MICRON TECHNOLOGY INC7 citations84
US6867148B2Mar 15, 2005
Removal of organic material in integrated circuit fabrication using ozonated organic acid solutions
MICRON TECHNOLOGY INC14 citations84
US6541391B2Apr 1, 2003
Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates
MICRON TECHNOLOGY INC13 citations84
US6417016B1Jul 9, 2002
Structure and method for field emitter tips
MICRON TECHNOLOGY INC15 citations84
US6399492B1Jun 4, 2002
Ruthenium silicide processing methods
MICRON TECHNOLOGY INC18 citations84
US9305782B2Apr 5, 2016
Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same
MICRON TECHNOLOGY INC3 citations82
US6952360B2Oct 4, 2005
Device with layer edges separated through mechanical spacing
MICRON TECHNOLOGY INC7 citations74
US6930017B2Aug 16, 2005
Wafer Cleaning method and resulting wafer
MICRON TECHNOLOGY INC8 citations74
US6905974B2Jun 14, 2005
Methods using a peroxide-generating compound to remove group VIII metal-containing residue
MICRON TECHNOLOGY INC9 citations74
US6835668B2Dec 28, 2004
Copper post-etch cleaning process
MICRON TECHNOLOGY INC10 citations74
US6653243B2Nov 25, 2003
Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates
MICRON TECHNOLOGY INC5 citations74
US7060631B2Jun 13, 2006
Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates
MICRON TECHNOLOGY INC4 citations63
US6955995B2Oct 18, 2005
Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates
MICRON TECHNOLOGY INC1 citations63
US11335563B2May 17, 2022
Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same
MICRON TECHNOLOGY INC0 citations62
US7585782B2Sep 8, 2009
Methods of forming semiconductor constructions, and methods of selectively removing metal-containing materials relative to oxide
MICRON TECHNOLOGY INC3 citations62
US6790786B2Sep 14, 2004
Etching processes for integrated circuit manufacturing including methods of forming capacitors
MICRON TECHNOLOGY INC4 citations61
US7077975B2Jul 18, 2006
Methods and compositions for removing group VIII metal-containing materials from surfaces
MICRON TECHNOLOGY INC1 citations52
US7023099B2Apr 4, 2006
Wafer cleaning method and resulting wafer
MICRON TECHNOLOGY INC0 citations52
US6933665B2Aug 23, 2005
Structure and method for field emitter tips
MICRON TECHNOLOGY INC1 citations52
MORGAN PAUL A
3 patentsKIEHLBAUCH MARK W
2 patentsLODESTAR LICENSING GROUP LLC
2 patentsUS12463044B2Nov 4, 2025
Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same
LODESTAR LICENSING GROUP LLC0 citations62
US11935756B2Mar 19, 2024
Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same
LODESTAR LICENSING GROUP LLC0 citations62