P

Inventor

MORGAN PAUL A

US40 patents
⚠️ This page may combine multiple inventors who share the name “MORGAN PAUL A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

29 patents
US6290863B1Sep 18, 2001

Method and apparatus for etch of a specific subarea of a semiconductor work object

MICRON TECHNOLOGY INC79 citations96
US6787450B2Sep 7, 2004

High aspect ratio fill method and resulting structure

MICRON TECHNOLOGY INC26 citations93
US6756682B2Jun 29, 2004

High aspect ratio fill method and resulting structure

MICRON TECHNOLOGY INC28 citations93
US6758938B1Jul 6, 2004

Delivery of dissolved ozone

MICRON TECHNOLOGY INC30 citations92
US6737283B2May 18, 2004

Method to isolate device layer edges through mechanical spacing

MICRON TECHNOLOGY INC19 citations92
US6645874B1Nov 11, 2003

Delivery of dissolved ozone

MICRON TECHNOLOGY INC34 citations92
US6589882B2Jul 8, 2003

Copper post-etch cleaning process

MICRON TECHNOLOGY INC26 citations92
US6017827AJan 25, 2000

System and method for mixing a gas into a solvent used in semiconductor processing

MICRON TECHNOLOGY INC41 citations91
US10607844B2Mar 31, 2020

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC4 citations84
US10096483B2Oct 9, 2018

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC6 citations84
US9761457B2Sep 12, 2017

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC7 citations84
US6867148B2Mar 15, 2005

Removal of organic material in integrated circuit fabrication using ozonated organic acid solutions

MICRON TECHNOLOGY INC14 citations84
US6541391B2Apr 1, 2003

Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates

MICRON TECHNOLOGY INC13 citations84
US6417016B1Jul 9, 2002

Structure and method for field emitter tips

MICRON TECHNOLOGY INC15 citations84
US6399492B1Jun 4, 2002

Ruthenium silicide processing methods

MICRON TECHNOLOGY INC18 citations84
US9305782B2Apr 5, 2016

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC3 citations82
US6952360B2Oct 4, 2005

Device with layer edges separated through mechanical spacing

MICRON TECHNOLOGY INC7 citations74
US6930017B2Aug 16, 2005

Wafer Cleaning method and resulting wafer

MICRON TECHNOLOGY INC8 citations74
US6905974B2Jun 14, 2005

Methods using a peroxide-generating compound to remove group VIII metal-containing residue

MICRON TECHNOLOGY INC9 citations74
US6835668B2Dec 28, 2004

Copper post-etch cleaning process

MICRON TECHNOLOGY INC10 citations74
US6653243B2Nov 25, 2003

Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates

MICRON TECHNOLOGY INC5 citations74
US7060631B2Jun 13, 2006

Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates

MICRON TECHNOLOGY INC4 citations63
US6955995B2Oct 18, 2005

Methods of cleaning surfaces of copper-containing materials, and methods of forming openings to copper-containing substrates

MICRON TECHNOLOGY INC1 citations63
US11335563B2May 17, 2022

Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including same

MICRON TECHNOLOGY INC0 citations62
US7585782B2Sep 8, 2009

Methods of forming semiconductor constructions, and methods of selectively removing metal-containing materials relative to oxide

MICRON TECHNOLOGY INC3 citations62
US6790786B2Sep 14, 2004

Etching processes for integrated circuit manufacturing including methods of forming capacitors

MICRON TECHNOLOGY INC4 citations61
US7077975B2Jul 18, 2006

Methods and compositions for removing group VIII metal-containing materials from surfaces

MICRON TECHNOLOGY INC1 citations52
US7023099B2Apr 4, 2006

Wafer cleaning method and resulting wafer

MICRON TECHNOLOGY INC0 citations52
US6933665B2Aug 23, 2005

Structure and method for field emitter tips

MICRON TECHNOLOGY INC1 citations52

MORGAN PAUL A

3 patents

KIEHLBAUCH MARK W

2 patents

LODESTAR LICENSING GROUP LLC

2 patents

DAYCOCK DAVID A

2 patents

ZHOU BAOSUO

1 patent

KIEHLBAUCH MARK

1 patent