Inventor
MIYASHITA MORIYA
JP11 patents
⚠️ This page may combine multiple inventors who share the name “MIYASHITA MORIYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
9 patentsUS5271796ADec 21, 1993
Method and apparatus for detecting defect on semiconductor substrate surface
TOSHIBA KK83 citations93
US5071776ADec 10, 1991
Wafer processsing method for manufacturing wafers having contaminant-gettering damage on one surface
TOSHIBA KK74 citations93
US7057259B2Jun 6, 2006
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
TOSHIBA KK35 citations92
US6037270AMar 14, 2000
Method of manufacturing semiconductor device and methods of processing, analyzing and manufacturing its substrate
TOSHIBA KK19 citations92
US4971920ANov 20, 1990
Gettering method for semiconductor wafers
TOSHIBA KK37 citations90
US5951755ASep 14, 1999
Manufacturing method of semiconductor substrate and inspection method therefor
TOSHIBA KK33 citations89
US4980300ADec 25, 1990
Gettering method for a semiconductor wafer
TOSHIBA KK42 citations89
US6222252B1Apr 24, 2001
Semiconductor substrate and method for producing the same
TOSHIBA KK16 citations83
US5508800AApr 16, 1996
Semiconductor substrate, method of manufacturing semiconductor substrate and semiconductor device, and method of inspecting and evaluating semiconductor substrate
TOSHIBA KK11 citations72