Inventor · disambiguated record
Alexandre Savtchouk
Also filed as: SAVTCHOUK ALEXANDRE
7 granted patents·2 pending applications·28 citations·filing 2002–2024
80Inventor score
Files withSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD5SEMICONDUCTOR DIAGNOSTICS INC2LAGOWSKI JACEK1SAVTCHOUK ALEXANDRE1
Top patents by PatentIndex Score
9 records- 0189US12027430B1Semiconductor doping characterization method using photoneutralization time constant of corona surface chargeSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2023·Granted Jul 2, 2024·1 cites·20 claims
- 0285US10969370B2Measuring semiconductor doping using constant surface potential corona chargingSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2015·Granted Apr 6, 2021·5 cites·18 claims
- 0373US12154833B2Semiconductor doping characterization method using photoneutralization time constant of corona surface chargeSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2024·Granted Nov 26, 2024·0 cites·24 claims
- 0467US6815974B1Determining composition of mixed dielectricsSEMICONDUCTOR DIAGNOSTICS INC·Filed 2003·Granted Nov 9, 2004·7 cites·24 claims
- 0560US6771091B2Method and system for elevated temperature measurement with probes designed for room temperature measurementSEMICONDUCTOR DIAGNOSTICS INC·Filed 2002·Granted Aug 3, 2004·13 cites·20 claims
- 0659US8093920B2Accurate measuring of long steady state minority carrier diffusion lengthsLAGOWSKI JACEK·Filed 2009·Granted Jan 10, 2012·2 cites·17 claims
- 0752US11561254B2Topside contact device and method for characterization of high electron mobility transistor (HEMT) heterostructure on insulating and semi-insulating substratesSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2021·Granted Jan 24, 2023·0 cites·10 claims
- 0842US2009047748A1Enhanced sensitivity non-contact electrical monitoring of copper contamination on silicon surfaceSAVTCHOUK ALEXANDRE·Filed 2008·Application pending·0 cites
- 0935US2018315630A1Charge Metrology for Integrated MeasurementSEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO LTD·Filed 2018·Application pending·0 cites
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