Inventor
MAEDA TATSUYA
JP47 patents
⚠️ This page may combine multiple inventors who share the name “MAEDA TATSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
13 patentsUS7366620B2Apr 29, 2008
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
HITACHI HIGH TECH CORP30 citations93
US8003940B2Aug 23, 2011
Tool-to-tool matching control method and its system for scanning electron microscope
HITACHI HIGH TECH CORP9 citations84
US7807980B2Oct 5, 2010
Charged particle beam apparatus and methods for capturing images using the same
HITACHI HIGH TECH CORP11 citations84
US7545977B2Jun 9, 2009
Image processing apparatus for analysis of pattern matching failure
HITACHI HIGH TECH CORP10 citations84
US7476857B2Jan 13, 2009
Tool-to-tool matching control method and its system for scanning electron microscope
HITACHI HIGH TECH CORP10 citations84
US7408154B2Aug 5, 2008
Scanning electron microscope, method for measuring a dimension of a pattern using the same, and apparatus for correcting difference between scanning electron microscopes
HITACHI HIGH TECH CORP12 citations84
US8384030B2Feb 26, 2013
Method and apparatus for setting sample observation condition, and method and apparatus for sample observation
HITACHI HIGH TECH CORP3 citations63
US7446313B2Nov 4, 2008
Scanning electron microscope
HITACHI HIGH TECH CORP4 citations63
US7433542B2Oct 7, 2008
Method for measuring line and space pattern using scanning electron microscope
HITACHI HIGH TECH CORP2 citations63
US7372047B2May 13, 2008
Charged particle system and a method for measuring image magnification
HITACHI HIGH TECH CORP2 citations63
US8872106B2Oct 28, 2014
Pattern measuring apparatus
HITACHI HIGH TECH CORP3 citations60
US7684937B2Mar 23, 2010
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
HITACHI HIGH TECH CORP0 citations52
US9000366B2Apr 7, 2015
Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns
HITACHI HIGH TECH CORP0 citations42
HITACHI LTD
9 patentsUS6627888B2Sep 30, 2003
Scanning electron microscope
HITACHI LTD30 citations96
US5598002AJan 28, 1997
Electron beam apparatus
HITACHI LTD68 citations96
US5512747AApr 30, 1996
Auto focusing apparatus of scanning electron microscopes
HITACHI LTD59 citations96
US5614713AMar 25, 1997
Scanning electron microscope
HITACHI LTD26 citations92
US6803573B2Oct 12, 2004
Scanning electron microscope
HITACHI LTD6 citations74
US7439505B2Oct 21, 2008
Scanning electron microscope
HITACHI LTD2 citations63
US7002151B2Feb 21, 2006
Scanning electron microscope
HITACHI LTD2 citations63
US12399013B2Aug 26, 2025
Power generation planning device and power generation planning method
HITACHI LTD0 citations44
US12191663B2Jan 7, 2025
Power supply and demand planning device
HITACHI LTD0 citations44
YAZAKI CORP
9 patentsUS5966806AOct 19, 1999
Control method of terminal crimping device
YAZAKI CORP24 citations91
US5921125AJul 13, 1999
Control method of terminal crimping device
YAZAKI CORP26 citations91
US5887469AMar 30, 1999
Terminal crimping device
YAZAKI CORP25 citations91
US5404634AApr 11, 1995
Wire ends processing apparatus
YAZAKI CORP23 citations90
US6738134B2May 18, 2004
Inspection method and inspection system of a terminal metal fitting
YAZAKI CORP17 citations84
US5901440AMay 11, 1999
Control method of terminal crimping device
YAZAKI CORP11 citations72
US5570191AOct 29, 1996
Identification of connector terminals
YAZAKI CORP7 citations67
US7409080B2Aug 5, 2008
Inspection method of electric part
YAZAKI CORP3 citations58
US7006681B2Feb 28, 2006
Inspection method of electrical part, inspection apparatus of electric junction box and inspection apparatus of terminal fittings
YAZAKI CORP4 citations58
MATSUI SHIKISO KAGAKU KOGYOSHO
2 patentsUS5221288AJun 22, 1993
Thermochromic dyeing method and cellulose product dyed thereby
MATSUI SHIKISO KAGAKU KOGYOSHO61 citations94
US5252103AOct 12, 1993
Pigmenting of cellulose textiles: treatment with cationic compound and immersion in aqueous pigment dispersion
MATSUI SHIKISO KAGAKU KOGYOSHO19 citations70