Inventor · disambiguated record
Tsung-Yung Chang
Also filed as: CHANG TSUNG-YUNG · CHANG TSUNG-YUNG JONATHAN
17 granted patents·5 pending applications·30 citations·filing 2005–2025
91Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD11CHANG TSUNG-YUNG JONATHAN3TAIWAN SEMICONDUCTOR MFG3CHANG TSUNG-YUNG1CHEN CHIEN-YUAN1
Top patents by PatentIndex Score
22 records- 0189US2025348394A1Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0288US11734142B2Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 22, 2023·1 cites·20 claims
- 0385US2025239299A1Pre-Charging Bit Lines Through Charge-SharingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0481US12300312B2Pre-charging bit lines through charge-sharingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted May 13, 2025·0 cites·20 claims
- 0581US11256588B2Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 22, 2022·1 cites·20 claims
- 0681US8724420B2SRAM write assist apparatusCHENG CHITING·Filed 2011·Granted May 13, 2014·8 cites·18 claims
- 0777US12436858B2Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 7, 2025·0 cites·20 claims
- 0872US7657767B2Cache leakage shut-off mechanismINTEL CORP·Filed 2005·Granted Feb 2, 2010·7 cites·23 claims
- 0969US11848047B2Pre-charging bit lines through charge-sharingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 19, 2023·0 cites·20 claims
- 1068US10410715B2Pre-charging bit lines through charge-sharingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 10, 2019·1 cites·20 claims
- 1167US9058899B2Data-aware SRAM systems and methods forming sameTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 16, 2015·2 cites·15 claims
- 1266US8091000B2Disabling portions of memory with defectsCHANG TSUNG-YUNG JONATHAN·Filed 2009·Granted Jan 3, 2012·6 cites·26 claims
- 1358US10705934B2Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 7, 2020·1 cites·19 claims
- 1456US10847217B2Pre-charging bit lines through charge-sharingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Nov 24, 2020·0 cites·20 claims
- 1555US8587992B2Data-aware SRAM systems and methods forming sameCHEN CHIEN-YUAN·Filed 2011·Granted Nov 19, 2013·1 cites·20 claims
- 1650US9922701B2Pre-charging bit lines through charge-sharingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 20, 2018·0 cites·20 claims
- 1748US2011161783A1Method and apparatus on direct matching of cache tags coded with error correcting codes (ecc)SOMASEKHAR DINESH·Filed 2009·Application pending·0 cites
- 1846US9299420B2Data-aware SRAM systems and methods forming sameTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Mar 29, 2016·0 cites·20 claims
- 1942US9076553B2SPSRAM wrapperTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 7, 2015·0 cites·20 claims
- 2041US8982659B2Bitline floating during non-access mode for memory arraysCHANG TSUNG-YUNG·Filed 2009·Granted Mar 17, 2015·2 cites·20 claims
- 2136US2010058109A1Disabling portions of memory with defectsCHANG TSUNG-YUNG JONATHAN·Filed 2009·Application pending·0 cites
- 2233US2008010566A1Disabling portions of memory with non-deterministic errorsCHANG TSUNG-YUNG JONATHAN·Filed 2006·Application pending·0 cites
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