Inventor
WHITE ERIC J
US51 patents
⚠️ This page may combine multiple inventors who share the name “WHITE ERIC J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
36 patentsUS5530280AJun 25, 1996
Process for producing crackstops on semiconductor devices and devices containing the crackstops
IBM58 citations96
US5508234AApr 16, 1996
Microcavity structures, fabrication processes, and applications thereof
IBM112 citations96
US5294570AMar 15, 1994
Reduction of foreign particulate matter on semiconductor wafers
IBM66 citations94
US7902629B2Mar 8, 2011
Integrated BEOL thin film resistor
IBM16 citations93
US6251775B1Jun 26, 2001
Self-aligned copper silicide formation for improved adhesion/electromigration
IBM46 citations93
US5514832AMay 7, 1996
Microcavity structures, fabrication processes, and applications thereof
IBM94 citations93
US6294105B1Sep 25, 2001
Chemical mechanical polishing slurry and method for polishing metal/oxide layers
IBM22 citations92
US6186873B1Feb 13, 2001
Wafer edge cleaning
IBM49 citations89
US5545921AAug 13, 1996
Personalized area leadframe coining or half etching for reduced mechanical stress at device edge
IBM34 citations89
US6340601B1Jan 22, 2002
Method for reworking copper metallurgy in semiconductor devices
IBM26 citations87
US7485540B2Feb 3, 2009
Integrated BEOL thin film resistor
IBM11 citations84
US9159671B2Oct 13, 2015
Copper wire and dielectric with air gaps
IBM5 citations83
US10438803B2Oct 8, 2019
Semiconductor structures having low resistance paths throughout a wafer
IBM1 citations73
US10177000B2Jan 8, 2019
Semiconductor structures having low resistance paths throughout a wafer
IBM1 citations73
US9620371B2Apr 11, 2017
Semiconductor structures having low resistance paths throughout a wafer
IBM3 citations73
US6355565B2Mar 12, 2002
Chemical-mechanical-polishing slurry and method for polishing metal/oxide layers
IBM5 citations73
US9613853B2Apr 4, 2017
Copper wire and dielectric with air gaps
IBM2 citations72
US6822472B1Nov 23, 2004
Detection of hard mask remaining on a surface of an insulating layer
IBM7 citations72
US5576246ANov 19, 1996
Personalized area leadframe coining or half etching for reduced mechanical stress at device edge
IBM13 citations71
US10173889B2Jan 8, 2019
Planar cavity MEMS and related structures, methods of manufacture and design structures
IBM0 citations63
US11167980B2Nov 9, 2021
Micro-electro-mechanical system (MEMS) structures and design structures
IBM0 citations62
US9230914B2Jan 5, 2016
Copper wire and dielectric with air gaps
IBM1 citations61
US9087839B2Jul 21, 2015
Semiconductor structures with metal lines
IBM2 citations61
US7223697B2May 29, 2007
Chemical mechanical polishing method
IBM2 citations61
US7824568B2Nov 2, 2010
Solution for forming polishing slurry, polishing slurry and related methods
IBM2 citations59
US6818992B1Nov 16, 2004
Self-aligned copper silicide formation for improved adhesion/electromigration
IBM3 citations59
US9691623B2Jun 27, 2017
Semiconductor structures having low resistance paths throughout a wafer
IBM0 citations52
US9478427B2Oct 25, 2016
Semiconductor structures having low resistance paths throughout a wafer
IBM0 citations52
US9312140B2Apr 12, 2016
Semiconductor structures having low resistance paths throughout a wafer
IBM0 citations52
US10589991B2Mar 17, 2020
Micro-electro-mechanical system (MEMS) structures and design structures
IBM0 citations51
US10589992B2Mar 17, 2020
Micro-electro-mechanical system (MEMS) structures and design structures
IBM0 citations51
US10549987B2Feb 4, 2020
Micro-electro-mechanical system (MEMS) structures and design structures
IBM0 citations51
US9981842B2May 29, 2018
Micro-Electro-Mechanical System (MEMS) structures and design structures
IBM0 citations51
US9969613B2May 15, 2018
Method for forming micro-electro-mechanical system (MEMS) beam structure
IBM0 citations51
US9938137B2Apr 10, 2018
Micro-electro-mechanical system (MEMS) structures and design structures
IBM0 citations51
US9932222B2Apr 3, 2018
Micro-electro-mechanical system (MEMS) structures and design structures
IBM0 citations51
GLOBALFOUNDRIES INC
3 patentsUS9269666B2Feb 23, 2016
Methods for selective reverse mask planarization and interconnect structures formed thereby
GLOBALFOUNDRIES INC0 citations52
US9708508B2Jul 18, 2017
Slurry for chemical-mechanical polishing of metals and use thereof
GLOBALFOUNDRIES INC0 citations49
US9390969B2Jul 12, 2016
Integrated circuit and interconnect, and method of fabricating same
GLOBALFOUNDRIES INC0 citations38
BATES GRAHAM M
3 patentsUS9057004B2Jun 16, 2015
Slurry for chemical-mechanical polishing of metals and use thereof
BATES GRAHAM M0 citations46
US8734665B2May 27, 2014
Slurry for chemical-mechanical polishing of copper and use thereof
BATES GRAHAM M1 citations46
US8210904B2Jul 3, 2012
Slurryless mechanical planarization for substrate reclamation
BATES GRAHAM M0 citations41
COMEAU JOSEPH K V
2 patentsHERRIN RUSSELL T
1 patentCHINTHAKINDI ANIL K
1 patentDANG DINH
1 patentANDERSON FELIX P
1 patentMCDEVITT THOMAS L
1 patentHE ZHONG-XIANG
1 patentShowing the top 50 of 51 patents by PatentIndex Score.