Inventor · disambiguated record
Alan Bahm
Also filed as: BAHM ALAN · BAHM ALAN S · BAHM ALAN STEPHEN
8 granted patents·4 pending applications·6 citations·filing 2013–2024
77Inventor score
Files withFEI CO12
Top patents by PatentIndex Score
12 records- 0193US11217425B2System and method for preparation and delivery of biological samples for charged particle analysisFEI CO·Filed 2020·Granted Jan 4, 2022·4 cites·26 claims
- 0289US11651924B1Method of producing microrods for electron emitters, and associated microrods and electron emittersFEI CO·Filed 2022·Granted May 16, 2023·1 cites·20 claims
- 0385US11749498B2System and method for preparation and delivery of biological samples for charged particle analysisFEI CO·Filed 2021·Granted Sep 5, 2023·1 cites·26 claims
- 0481US12165839B2System and method for preparation and delivery of biological samples for charged particle analysisFEI CO·Filed 2023·Granted Dec 10, 2024·0 cites·23 claims
- 0567US11749492B2Mechanically-stable electron sourceFEI CO·Filed 2022·Granted Sep 5, 2023·0 cites·26 claims
- 0664US2025322678A1Sample support grid recognitionFEI CO·Filed 2024·Application pending·0 cites
- 0760US11782385B2Reconstruction algorithms of electron-based hologramsFEI CO·Filed 2019·Granted Oct 10, 2023·0 cites·18 claims
- 0859US11450508B2Comparative holographic imagingFEI CO·Filed 2019·Granted Sep 20, 2022·0 cites·18 claims
- 0959US2025316440A1Hybrid background extraction in electron holographyFEI CO·Filed 2024·Application pending·0 cites
- 1056US2025155847A1Increasing information resulting from apodizationFEI CO·Filed 2023·Application pending·0 cites
- 1152US2025371711A1Classification of substrate regionsFEI CO·Filed 2024·Application pending·0 cites
- 1251US9204036B2Image-enhancing spotlight mode for digital microscopyFEI CO·Filed 2013·Granted Dec 1, 2015·0 cites·24 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →